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Processing method and processing system of DDR (Double Data Rate) test waveform data file

A technology of waveform data and test data, applied in electrical digital data processing, special data processing applications, word processing, etc., can solve problems such as prone to errors and heavy workload, and achieve high reliability

Inactive Publication Date: 2017-05-10
CIG SHANGHAI
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  • Abstract
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  • Claims
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Problems solved by technology

[0003] The technical problem to be solved by the present invention is to overcome the defects of large workload and prone to errors caused by manual processing of test waveforms for DDR testing in the prior art, and provide a processing method and processing system for DDR test waveform data files

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  • Processing method and processing system of DDR (Double Data Rate) test waveform data file
  • Processing method and processing system of DDR (Double Data Rate) test waveform data file

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Embodiment Construction

[0026] The present invention is further illustrated below by means of examples, but the present invention is not limited to the scope of the examples.

[0027] Such as figure 1 Shown, a kind of processing method of DDR test waveform data file comprises the following steps:

[0028] Step 101, traverse all the original data files of DDR test waveforms and form a tree list. After the oscilloscope tests the DDR, save the corresponding test waveform and CSV format data files. Then execute the traversal of the original data files of the above-mentioned test waveforms to form a tree list.

[0029] Step 102: Perform format conversion on the original data and use the first parameter to filter, and use the filtered data as direct test data. The first parameter includes standard high level value, standard low level value, frequency, duty cycle, rising slope, falling slope, maximum value, minimum value and so on. For example, you can convert a CSV format data document into an Excel fo...

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Abstract

The invention discloses a processing method and processing system of a DDR (Double Data Rate) test waveform data file. The processing method of the DDR test waveform data file comprises the following steps: S1, carrying out traversing on an original data file of all DDR test waveforms and forming a tree-like list; S2, carrying out format conversion on the original data file and screening by adopting a first parameter; taking screened data as direct test data; S3, converting the direct test data into indirect test data by adopting a second parameter; S4, comparing the direct test data and the indirect test data with corresponding standard evaluation data respectively. The processing method and processing system of the DDR test waveform data file, disclosed by the invention, can be used for automatically extracting data from the DDR test waveform data file; a testing result is automatically judged and a testing report is automatically output, and the reliability is high.

Description

technical field [0001] The invention relates to the technical field of DDR testing, in particular to a processing method and system for DDR testing waveform data files. Background technique [0002] Existing DDR (Double Rate Synchronous Dynamic Random Access Memory) test data is manually processed. Testers copy the data in turn according to the test waveform and write it into an Excel table, which takes a lot of time, especially when the number of DDR particles is large. In addition, first of all, the existing test data processing needs to generate indirect test data based on direct test data. In this process, manual input formulas or calculations may have errors, resulting in abnormal final judgments; secondly, it is necessary to manually determine whether the direct test data and indirect test data are All meet the requirements, and both meet the requirements before it can be deemed successful. There may be human errors, resulting in an abnormal final judgment, and it take...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/12G06F17/24
CPCG06F40/18G11C29/12G11C2029/4402
Inventor 赵志强
Owner CIG SHANGHAI
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