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A Method for Measuring Pit Depth with Variable Datum

A technology of depth measurement and datum, applied in measurement devices, instruments, optical devices, etc., can solve the problems of narrow measurement range, diverse measurement results, and inability to measure at any time, and achieve the effect of simple method and easy and fast operation.

Active Publication Date: 2019-01-18
NANJING UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In order to overcome the deficiencies of the existing pit depth measurement methods, such as the diversity of the selection of the datum surface, the measurement results are diverse; some tiny pits are difficult to touch and measure; some measuring instruments have high requirements for the measurement environment and cannot be measured at any time; the measurement range Narrow; laser measurement is mainly used to measure the distance of a single target and cannot be used for depth measurement; the accuracy and precision of the measurement results are not high, time-consuming and labor-intensive. Depth measurement method, this measurement method combines the principle of laser distance measurement and adopts non-contact measurement, the reference plane is selected accurately, the application range is large, the accuracy and precision of the measurement results are greatly improved, the operation is simple and fast, saving time and effort

Method used

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  • A Method for Measuring Pit Depth with Variable Datum
  • A Method for Measuring Pit Depth with Variable Datum
  • A Method for Measuring Pit Depth with Variable Datum

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Experimental program
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Effect test

Embodiment 1

[0026] see figure 1 , the specific process of the method for measuring the depth of micro pits with variable datum level of the present invention is:

[0027] Step 1: The laser starts to rotate along a semicircular orbit from 0 degrees, where the center of the semicircular orbit is the pit to be measured, and the transmitting end emits a single laser beam to the pit to be measured for scanning, such as image 3 , using the principle of straight-line propagation and reflection of light, the signal processing unit in the laser processes the result to obtain the distance from the laser beam to multiple points in the pit. This value can constitute an isometric diagram of the pit to be measured, as shown in Figure 6 . An isometric map can be obtained for each scan.

[0028] Step 2: If Figure 6 , the equidistance line on the isometric diagram is a closed circular line, choose any equidistance line 3 (circular line) from the isometric diagram, its value is 50.4, and the value o...

Embodiment 2

[0032] The specific process of a method for measuring the depth of micro pits with variable datum level of the present invention is:

[0033] Step 1: The laser starts to rotate along a semicircular orbit from 0 degrees, where the center of the semicircular orbit is the pit to be measured, and the transmitting end emits a single laser beam to the pit to be measured for scanning, such as image 3 , using the principle of straight-line propagation and reflection of light, the signal processing unit in the laser processes the result to obtain the distance from the laser beam to multiple points in the pit, which can constitute an isometric map of the pit to be measured. An isometric map can be obtained for each scan.

[0034] Step 2: see Figure 5, due to the existence of cracks, in the obtained isometric diagrams, some isometric diagrams may have the situation that the equidistance lines cannot be closed. When this happens, if the value of one of the equidistance lines is 603.2, ...

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Abstract

The invention discloses a variable-reference-surface pit depth measurement method. The method comprises the following steps of scanning a to-be-measured pit by a single laser beam along a semicircular track in a manner of n DEG each time, and forming an isometric graph according to data obtained in each scanning; if the isometric graph is not closed, abandoning ineffective values by means of an algorithm, selecting new effective values, and forming a closed isometric graph; and if the isometric graph is closed, obtaining an upper reference surface and a lower reference surface of the to-be-measured pint by means of the algorithm, wherein a difference between the upper reference surface and the lower reference surface is the depth DELTAdelta1 of the to-be-measured pint in this scanning, and finally comparing the depths in 180 / n times, wherein the maximal depth is the actual pit depth. According to the measurement method, selection of multiple reference surfaces can be performed, and measurement value comparison is performed so that higher accuracy is realized in pit reference surface selection; noncontact measurement is utilized, and the pits which cannot be contacted can be measured; measurement can be performed on the conditions such as tearing and penetrating; the measurement method can be used in field; furthermore the measurement method has advantages of simple and quick operation, and effective time and labor saving.

Description

technical field [0001] The invention belongs to a method for measuring depth, in particular to a method for measuring the depth of pits with variable reference planes, and is especially used for measuring the depth of pits on the surface of materials in industrial production, especially the depth of multiple bullets on the surface of anti-ballistic materials. Background technique [0002] In industrial production, pits and other defects may appear on the surface of some produced materials. According to product quality inspection requirements, it is usually necessary to detect the depth of these pits. In some other occasions, such as the anti-elasticity test of some materials, after the target test is completed, it is necessary to measure the depth of the crater, especially the crater of multiple bullets. Therefore, it is necessary to study the measurement method of pits. At present, the methods for measuring the depth size of pits include vernier caliper measurement and dep...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/22
CPCG01B11/22
Inventor 周琦蔡雅君彭勇王克鸿孔见冯曰海朱军张德库黄俊薛鹏
Owner NANJING UNIV OF SCI & TECH