Full-reference screen image quality assessment method combining wavelet and corner features
A corner feature and screen image technology, applied in the field of image processing, can solve the problems of not fully considering the characteristics of the screen image, not being able to accurately evaluate the quality of the screen image, and being difficult for practical application.
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[0065] The present invention will be further described below through specific embodiments.
[0066] refer to figure 1 , a full-reference screen image quality assessment method combining wavelet and corner features, including the following steps:
[0067] 1) Input a reference screen image r and a distorted screen image d, respectively perform grayscale processing on the reference screen image r and the distorted screen image d, and convert the input color image into a grayscale image;
[0068] 2) Extract the corner feature cf of the reference screen image r and the distorted screen image d respectively r (x,y), cf d (x,y). The corner features of the reference screen image r are extracted, and the steps are as follows:
[0069] 2.1a) Calculate the difference graphs in the horizontal direction and vertical direction for the reference screen image r respectively, The calculation steps are as follows:
[0070]
[0071] Wherein, r(x, y) is the pixel of the (x, y) position ...
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