A full-reference screen image quality assessment method combining wavelet and corner features
A technology of screen image and corner point features, applied in the field of image processing, can solve the problems of insufficient consideration of screen image characteristics, time-consuming and labor-intensive, and difficulty in practical application.
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[0065] The present invention will be further described below through specific embodiments.
[0066] refer to figure 1 , a full-reference screen image quality assessment method combining wavelet and corner features, including the following steps:
[0067] 1) Input a reference screen image r and a distorted screen image d, respectively perform grayscale processing on the reference screen image r and the distorted screen image d, and convert the input color image into a grayscale image;
[0068] 2) Extract the corner feature cf of the reference screen image r and the distorted screen image d respectively r (x,y), cf d (x,y). The corner features of the reference screen image r are extracted, and the steps are as follows:
[0069] 2.1a) Calculate the difference graphs in the horizontal direction and vertical direction for the reference screen image r respectively, The calculation steps are as follows:
[0070]
[0071] Wherein, r(x, y) is the pixel of the (x, y) position ...
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