A vacuum storage and testing device for transmission electron microscope sample rod

Abstract

A vacuum storing and testing device for transmission electron microscope sample rods belongs to the field of transmission electron microscope vacuum fittings. In storage of the sample rods, energizing testing and heating testing can be performed on the sample rods. The device comprises the components of a movable frame, a vacuum pump system, a vacuum measuring-and-displaying system, a vacuum cap, a valve system, a sample rod storing assembly and a plug. The device realizes simultaneous storage of multiple sample rods and is provided with an adding window which is reserved. The device can pump the air pressure in a chamber from atmosphere pressure to 4*10<-4> Pa within five minutes, and a limit vacuum pressure can reach 5*10<-5> Pa. The vacuum storing and testing device has advantages of effectively preventing electron microscope pollution caused by pollution or erosion by the sample rods in placement at outside, greatly reducing pre-pumping time of the sample rods in the electron microscope, realizing higher speed in reaching a stable vacuum degree of the electron microscope and prolonging service life of the sample rods. The vacuum storing and testing device further realizes benefits of convenient operation, high vacuum degree, easy adding of sample rod storing stations, and high suitability for different types of transmission electron microscope sample rods.

Description

Technical field: [0001] The invention relates to a vacuum storage and testing device for a transmission electron microscope sample rod, which is used for pre-vacuumizing and storing the transmission electron microscope sample rod, and performing pretreatment on the transmission electron microscope sample before entering the electron microscope, so as to ensure that the sample rod and the sample are dry and clean, shorten the The pre-extraction time of the transmission electron microscope reduces the pollution of the sample rod to the transmission electron microscope and improves the service life of the sample rod. In this device, the sample rod of the transmission electron microscope can also be energized, heated and other debugging tests in a working vacuum environment. The invention belongs to the field of transmission electron microscope vacuum accessories. Background technique: [0002] Since the invention of the transmission electron microscope in the 1930s, especially ...

AI Technical Summary

Problems solved by technology

Whether the sample rod is clean or not and the state of its own gas storage will directly affect the cleanliness of the TEM vacuum system and the pre-vacuum time. Boots, goniometer, etc. will be polluted to varying degrees, affecting the normal use of the transmission electron microscope

[0009] If the sample rod / is exposed to the atmosphere, its surface will generally be polluted, which will not only affect the life of the sample rod itself, but also cause damage to the vacuum system of the transmission electron microscope and pollute the components of the transmission electron microscope; at the same time, if it is exposed to the atmosphere for a long time, it will also make the sample The rod stores a certain amount of gas, which affects the pre-evacuation of the TEM

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