Device and method for measuring thermal expansion coefficient of material by using single slit diffraction

Abstract

The invention discloses a device for measuring a thermal expansion coefficient of a material by using single slit diffraction. The device is characterized by comprising a laser (1), wherein the laser (1) is matched with a single slit device (2), and the single slit device (2) is matched with an observation device (3). The experiment device for measuring micro displacement by a diffraction method is designed in order to solve various problems in the traditional measurement method of the thermal expansion coefficient of the material; the device is simple to operate and convenient to adjust; indirect conversion between various parameters in the traditional method or structure is removed; an error source is reduced; moreover, parameters to be read by the device are not required to be observed via a telescope; and the parameter reading is more direct and accurate. A special structure of the device allows light rays to pass to result in no shielding article in slits of diffraction fringes in a measurement process, and the clarity of the diffraction fringes projected on an observation screen device is ensured.

Description

technical field [0001] The invention relates to a detection device for the thermal expansion coefficient of a material, in particular to a device for measuring the thermal expansion coefficient of a material by single-slit diffraction, and a method for measuring and calculating the thermal expansion coefficient of a material by using the device. Background technique [0002] The coefficient of thermal expansion is an important physical quantity that describes the deformation of solid materials under temperature changes. It is a physical quantity commonly used in engineering technology and scientific research. The measurement of thermal expansion coefficient is also one of the classic experiments in university physics experiments. [0003] The measurement of the coefficient of thermal expansion in the prior art mainly includes: the optical lever method, the side-shifting microscope method, and the like. In some tests, especially in university physics experiments, the existi...

AI Technical Summary

Problems solved by technology

The measurement method and device have the following disadvantages: it is to measure the tiny length change after being amplified by the optical lever method, so when looking at the scale image in the plane mirror through the telescope, it will be difficult to adjust the image; in traditional measurement, it is The optical path of the non-vertical plane is approximately regarded as the optical path of the same vertical plane, and there is a certain error; the reading of the scale is observed through the telescope, which will cause visual difference when observing, and the accuracy of the scale is low

In order to solve the above problems, there are papers and patents that use the principle of single-slit diffraction to measure the thermal expansion coefficient of incoming materials, but these technologies still have certain problems. One of the problems is that it causes visual difference when observing and artificially adjusts the metal rod. will cause error

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