Method for monitoring neutron radiation environment by using SRAM memorizers

A technology for environmental monitoring and storage, applied in the field of radiation detection, can solve problems such as large measurement error and radioactivity, and achieve the effects of easy implementation, low cost, and high measurement accuracy

Active Publication Date: 2017-06-13
NORTHWEST INST OF NUCLEAR TECH
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Problems solved by technology

[0004] In order to solve the technical problem of large measurement error and radioactivity in the existing neutron radiation parameter measure

Method used

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  • Method for monitoring neutron radiation environment by using SRAM memorizers
  • Method for monitoring neutron radiation environment by using SRAM memorizers
  • Method for monitoring neutron radiation environment by using SRAM memorizers

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Embodiment Construction

[0026] The single event effect is the ionizing radiation damage effect caused by the interaction between a single ray particle and the sensitive area of ​​the microelectronic device. The single event effect can cause the stored data of the digital circuit to flip, and the function of the electronic system is disordered. With the improvement of semiconductor process integration, the characteristic process size of CMOS process integrated circuits is continuously reduced, and it is also more and more sensitive to single event effects. Although the single event effect has a serious impact on the reliability of the electronic system, because the single event effect is a random effect, its linear and thresholdless effect characteristics can be used to monitor the particle beam flow in the radiation environment.

[0027] According to the characteristics of single event effects, they can be roughly divided into two categories: non-destructive and destructive. The former is called the ...

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Abstract

The invention belongs to the field of radiation detection and relates to a method for monitoring the neutron radiation environment by using SRAM memorizers. The method includes the following steps that 1, neutron radiation calibration is conducted on SRAM memorizers different in types respectively, and a relation curve of the data flipping number and the neutron fluence are drawn; 2, the N type SRAM memorizer with the data flipping number keeping a linear relation with the neutron fluence is screened out, and the slope of the fitting curve serves as the neutron single ion effect flipping section of the N type SRAM memorizer; 3, the N type SRAM memorizer is placed in a to-be-monitored neutron radiation environment, and a relation curve of the data flipping number and the neutron fluence is drawn. According to the method, the linear and non-threshold characteristics of the neutron single ion flipping effects of the SRAM memorizers are made use of, neutron fluence monitoring in a reactor, a neutron accelerator and other neutron radiation environments is achieved, and experimental results show that the method can still maintain high measurement when the neutron fluence is very low.

Description

technical field [0001] The invention belongs to the field of radiation detection and relates to a method for monitoring neutron radiation environment by using SRAM memory. Background technique [0002] The neutron radiation environment is generally produced by reactors, accelerators and other facilities. Monitoring the neutron radiation environment is one of the necessary means to study the performance of nuclear devices. Monitoring the neutron radiation environment can be used to analyze whether the operation of nuclear facilities is stable; The measurement of neutron radiation environment is very important for nuclear technology application research using neutron radiation environment, and the accuracy of neutron radiation parameter measurement is an important prerequisite for carrying out related research. [0003] At present, the measurement of neutron radiation parameters such as reactors and neutron accelerators usually uses methods such as activated foil measurement. ...

Claims

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Application Information

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IPC IPC(8): G01T3/08G11C11/413
CPCG01T3/08G11C11/413
Inventor 陈伟刘岩郭晓强杨善潮齐超
Owner NORTHWEST INST OF NUCLEAR TECH
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