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Method for identifying bad blocks of solid state disk

A technology of solid-state hard drives and bad blocks, applied in static memory, instruments, etc., can solve problems such as data loss and bad blocks, and achieve the effect of reducing the probability of bad blocks and data loss

Active Publication Date: 2017-07-25
RAMAXEL TECH SHENZHEN
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to its hardware, NAND may generate bad blocks during production and practical use. If bad blocks occur during use, this may cause the risk of data loss.

Method used

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  • Method for identifying bad blocks of solid state disk
  • Method for identifying bad blocks of solid state disk
  • Method for identifying bad blocks of solid state disk

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Embodiment Construction

[0013] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0014] figure 2 It is a graph showing the relationship between newly added bad blocks and the number of times of erasure; after statistical analysis of big data on the probability distribution of bad blocks in NAND storage units, it is found that the probability of bad blocks appearing in the initial stage of use is much greater than that of bad blocks appearing after a period of use Therefore, the consequence is that users are particularly prone to data loss in t...

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Abstract

The invention discloses a method for identifying bad blocks of a solid state disk. The method is characterized in that bad block aging check operation is added to the solid state disk; in the bad block aging check operation, initial bad block marks of a storage chip are scanned, an initial bad block table is established, and specified round check operation is added to a storage unit of the solid state disk; in the check operation, the bad block table is read, and all normal blocks are subjected to erasure operation, writing operation, reading operation and operation of checking the number of bit errors in each block according to information in the bad block table; and when the erasure operation fails, the writing operation fails or it is checked in each round that the number of the bit errors in the blocks exceeds a preset error correction threshold, the blocks are marked as the bad blocks, and bad block information is added to the bad block table. The easily damaged blocks of the solid state disk in an early stage of use are exposed and identified in advance, so that the bad block probability during use of users is reduced and the risk of user data loss is effectively lowered.

Description

technical field [0001] The invention relates to the field of storage device design, in particular to a method for realizing bad block identification of a solid-state hard disk. Background technique [0002] figure 1 It is the composition structure of NAND. The solid-state hard disk in the prior art supports multi-channel DIE parallel operation. Each channel is composed of several blocks, and each Block is composed of multiple pages. NAND determines the Block It is the smallest unit of erase operation, and Page is the smallest unit of programming; any Page must perform an erase operation on the Block where it is located before performing a programming operation on it. Due to its hardware, NAND may generate bad blocks during production and practical use. If bad blocks occur during use, this may cause the risk of data loss. Therefore, if the risk of bad blocks occurring in NAND during user use can be avoided or reduced or the probability of occurrence can be reduced, the qual...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 王猛韩道静徐伟华姚鸣强
Owner RAMAXEL TECH SHENZHEN
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