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A method for identifying bad blocks in solid-state hard drives

A technology of solid-state hard drives and bad blocks, applied in static memory, instruments, etc., can solve problems such as data loss and bad blocks, and achieve the effect of reducing the probability of bad blocks and data loss

Active Publication Date: 2020-06-16
RAMAXEL TECH SHENZHEN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to its hardware, NAND may generate bad blocks during production and practical use. If bad blocks occur during use, this may cause the risk of data loss.

Method used

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  • A method for identifying bad blocks in solid-state hard drives
  • A method for identifying bad blocks in solid-state hard drives
  • A method for identifying bad blocks in solid-state hard drives

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Embodiment Construction

[0013] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0014] figure 2 It is a diagram of the relationship between newly added bad blocks and the number of erasures; after statistical analysis of big data, the probability distribution of bad blocks in the storage unit of NAND, it is found that the probability of bad blocks in the initial period of use is much greater than that after a period of use Probability, therefore, the consequence is that users are particularly prone to data loss in t...

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Abstract

The invention discloses a method for identifying bad blocks of a solid state disk. The method is characterized in that bad block aging check operation is added to the solid state disk; in the bad block aging check operation, initial bad block marks of a storage chip are scanned, an initial bad block table is established, and specified round check operation is added to a storage unit of the solid state disk; in the check operation, the bad block table is read, and all normal blocks are subjected to erasure operation, writing operation, reading operation and operation of checking the number of bit errors in each block according to information in the bad block table; and when the erasure operation fails, the writing operation fails or it is checked in each round that the number of the bit errors in the blocks exceeds a preset error correction threshold, the blocks are marked as the bad blocks, and bad block information is added to the bad block table. The easily damaged blocks of the solid state disk in an early stage of use are exposed and identified in advance, so that the bad block probability during use of users is reduced and the risk of user data loss is effectively lowered.

Description

Technical field [0001] The invention relates to the field of storage device design, in particular to a method for implementing bad block identification of a solid state hard disk. Background technique [0002] figure 1 It is the composition structure of NAND. The existing technology solid-state drives support multi-channel DIE parallel operation. Each channel is composed of several blocks, and each block is composed of multiple pages; NAND determines Block due to its storage principle. It is the smallest unit of erasing operation, Page is the smallest unit of programming; any page must erase the block where it is located before programming it. Due to its hardware, NAND may produce bad blocks during production and practical use. If bad blocks occur during use, it may cause the risk of data loss. Therefore, if it is possible to avoid or reduce the risk of bad blocks or reduce the probability of occurrence of NAND in the user's use process, the quality and practical life of the sol...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 王猛韩道静徐伟华姚鸣强
Owner RAMAXEL TECH SHENZHEN
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