Measuring apparatus and correction method of wavelength drift in different view fields for narrowband light filter
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
- Publication Date
- 2017-07-28
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Abstract
Description
Measuring device and correction method for wavelength drift in different fields of view of narrowband optical filter technical field The invention relates to the field of remote sensing imaging, including remote sensing imaging of ground or astronomical targets, and in particular to a measuring device and correction method for wavelength drift of different fields of view of narrow-band filters. Background technique In the field of remote sensing observation, such as space-to-Earth observation or space-based and ground-based astronomical observation, narrow-band imaging observations are often carried out on a certain absorption line or emission line with a narrow-band filter to obtain more abundant information about the observation target. For example, in solar observation, the continuum of visible light bands is formed in the photosphere. If you want to observe the upper atmosphere of the sun such as the chromosphere, you can only observe near the line center of the chromos...