Partitionable multi-process high-low temperature test box

Abstract

The invention discloses a partitionable multi-process high-low temperature test box. The partitionable multi-process high-low temperature test box comprises a test box body, a test box door, heating systems, refrigerating units, airflow circulation fans, temperature measuring devices and a test box controller, and further comprises movable partition plates for partitioning the test box body into a plurality of test partitions; partition plate test holes are formed in the movable partition plates; a top plate groove, a back plate groove and a bottom plate groove for accommodating the movable partition plates are formed in the test box body; the test partition are provided with the heating systems, the refrigerating units, the airflow circulation fans and the temperature measuring devices; the heating systems, the refrigerating units, the airflow circulation fans and the temperature measuring devices are controlled by one test box controller. The test box boy can be partitioned into a plurality of test partitions as required, each test partition can perform tests independently, and the high-low temperature test box can operate a plurality of test sections simultaneously and can be used for performing tests on a plurality of tested products with different or same conditions.

Description

technical field [0001] The invention relates to a high and low temperature test chamber, in particular to a high and low temperature test chamber which can simultaneously test a plurality of test objects under different or same conditions. Background technique [0002] High and low temperature test chambers have been widely used in various fields and industries of modern industry. The equipment can be used for high and low temperature work, high and low temperature storage, temperature cycle and other tests to verify the environmental adaptability and reliability of the product. [0003] Such as figure 1 The existing conventional high and low temperature test chamber shown has only one test area, and is equipped with only one set of heating system, refrigeration unit, air circulation fan, temperature measuring device and test chamber controller, so the existing conventional high and low temperature test chamber only has Single-process test capability: that is, only one tes...

AI Technical Summary

Problems solved by technology

[0005] 1) If the distance between the test chambers exceeds the length of the specified cable, the test cannot be carried out (the length of some signal cables is specified, and if the cable is too long, it will cause signal attenuation and cause the test product to fail to work);

[0006] 2) Each test chamber operates independently. Due to the time error between the test chambers, the synchronization of the test cannot be guaranteed, which affects the quality of the test;

[0007] 3) If the laboratory does not have enough test chambers, the test cannot be carried out, which will affect the progress of the test;

[0008] 4) If the test volume is not large, purchasing too many test chambers will cause waste of resources;

[0009] 5) The size of the test chamber is fixed, which cannot meet the test needs of the equipment under test with different volume sizes;

[0010] 6) There is a contradiction between the investment in purchasing large-scale test equipment and the utilization rate

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