A quantum tiltmeter based on atomic interference

A technology of atomic interference and inclinometer, applied in the direction of measuring inclination, instruments, measuring devices, etc., can solve problems such as inability to achieve high-precision absolute inclination measurement, and achieve the effect of accurate measurement, high stability, and simplified experimental devices

Active Publication Date: 2019-11-12
HUAZHONG UNIV OF SCI & TECH
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the defects of the prior art, the present invention proposes a quantum inclinometer based on atomic interference technology, the purpose of which is to realize absolute tilt measurement in principle, aiming to solve the problem that high-precision absolute tilt measurement cannot be realized in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A quantum tiltmeter based on atomic interference
  • A quantum tiltmeter based on atomic interference
  • A quantum tiltmeter based on atomic interference

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0020] In view of the shortcomings of the prior art, the present invention proposes a quantum inclinometer that can realize high-precision absolute measurement of inclination. At the same time, the present invention can realize inclination measurement in two-dimensional directions. Compared with the inclination measurement in one-dimensional direction, the two-dimensional direction The tilt measurement only needs to change the optical pulse configuration, which greatly simplifies the experimental setup.

[0021] The invention relates to the technical field of atomic interference measurement inertia...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a quantum tilt meter based on atom interference. The quantum tilt meter comprises an atom preparation module, an atom interference module and an atom detection module, wherein the atom preparation module is used for producing atoms required by interference measurement; the atom interference module comprises an atom interference unit and a light pulse sequence production unit; the atom interference unit is used for providing an atom interference area, and the light pulse sequence production unit is used for producing a phi / 2-phi-phi / 2 light pulse sequence; the atom detection module is used for detecting the atoms with different internal states after interference is completed. The quantum tilt meter has the advantages that the high-accuracy absolute measuring of the tilt can be realized; the tilt in the two-dimensional direction can be measured, and compared with the tilt measurement in the one-dimensional direction, only the light pulse configuration is needed to be changed, so that the experiment device is greatly simplified.

Description

technical field [0001] The invention belongs to the technical field of atomic inertia measurement, and more specifically relates to a quantum inclinometer based on atomic interference. Background technique [0002] In the past two decades, atomic interferometer technology has been rapidly developed and widely used. Using the quantum properties of atoms with wave-particle duality, many precision measurement experiments based on atomic interference have been developed rapidly and widely. Applied to the measurement of gravitational acceleration g, gravity gradient, rotation, fine structure constant, and Newton's gravitational constant; atomic interference is also used in basic physics, and it can be used to test the equivalence principle and Lorentz violation, etc. Recently, both France and the United States have proposed A scheme for atomic interferometry of gravitational waves. More and more scientists are devoting themselves to the development of cold atom interferometry, a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01C9/00
CPCG01C9/00
Inventor 胡忠坤周敏康段小春徐文杰赵苗苗张柯
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap