Point-diffraction digital holographic measurement device and method for polarization state parameters

Abstract

The invention provides a point-diffraction type digital holographic measurement device and method for a polarization state parameter, and belongs to the field of polarization state parameter measurement. The method comprises the steps: enabling a linearly polarized incident light beam to be divided into focused reference light and object light; enabling the reference light to irradiate a hole array, enabling the reference light filtered by a needle hole A to sequentially pass through a second lens and a polarization light-splitting prism to be divided into two beams with the orthogonal polarization states, enabling the two beams to respectively irradiate two plane reflectors to be reflected, and enabling the reflected beams to sequentially pass through the polarization light-splitting prism, a second lens, two big holes B of the hole array and a non-polarization light-splitting prism to irradiate a fourth lens; enabling the object light to pass through a third lens to irradiate the third lens and to be reflected, and then enabling the reflected object light to sequentially pass through the third lens and the non-polarization light-splitting prism to irradiate the fourth lens; gathering the reference light and object light on the fourth lens, generating interference on an image sensor plane, forming holograms which are orthogonal in a carrier frequency direction, uploading the holograms to a computer through an image sensor, and obtaining a Stokes matrix parameter and a Jones matrix parameter through the computer.

Description

technical field [0001] The invention relates to a point-diffraction digital holographic measurement device and method for polarization state parameters, belonging to the field of polarization state parameter measurement. Background technique [0002] Polarization state is one of the important parameters to describe the wavefront characteristics of light waves. It can be characterized by Stokes matrix parameters and Jones matrix parameters. Its measurement has important scientific significance and significance in the fields of biophotonics, nonlinear optics, chemistry and mineralogy Value. However, the traditional polarization state measurement device can only provide polarization information at a fixed position in the propagation direction of the wavefront to be measured, and because it does not have two-dimensional sampling characteristics, frequent adjustment of the optical path and multiple exposures are required to achieve the measurement of polarization state parameters...

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Problems solved by technology

However, this method requires two-dimensional grating and hole array matching, supplemented by two polarizers with orthogonal polarization, which is not only complex in structure, but also difficult to adjust

[0005] Patent CN 104198040 B "A Holographic Measurement Method and Implementing Device for Two-dimensional Jones Matrix Parameters" utilizes dual two-dimensional grating spectroscopic technology combined with spectrum multiplexing technology to realize Jones matrix parameter measurement through one exposure, but the device not only further increases The complexity of the system is increased, and the light utilization rate is high. At the same time, due to the use of a separate optical path structure, the anti-interference ability is poor

[0006] Yuan Caojin from Nanjing Normal University et al. (Ma Jun, Yuan Caojin, Feng Shaotong, Nie Shouping, "Full Field Polarization Measurement Method Based on Digital Holography and Multiplexing Technology", Acta Phys. 22, 224204 (2013)) used polarization and Angle division multiplexing technology can realize Stokes matrix parameter and Jones vector measurement through one exposure, but because of the use of a separate optical path structure, the anti-interference ability is poor; at the same time, due to the structural limitation, the polarization orthogonal spectrum is limited in the spectrum space, and then Cause crosstalk and affect the measurement accuracy of polarization state parameters

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