A Method for Predicting the Number of Software Defects Based on Feature Selection and Ensemble Learning
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- WUHAN UNIV
- Publication Date
- 2020-03-10
- Estimated Expiration
- Not applicable Β· inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of software defect prediction, in particular to a method for predicting the number of software defects based on feature selection and integrated learning. Background technique
[0002] (1) Software defect number prediction technology
[0003] Software has become an important factor affecting national economy, military affairs, politics and even social life. Highly reliable and complex software systems depend on the reliability of the software they employ. Software defects are the potential source of related system errors, failures, crashes, and even machine crashes. The so-called defect, so far, there are many related terms and definitions in academia and industry, such as failure, defect, bug, error, error, failure, failure, etc. According to ISO 9000, the definition of a defect is: to meet the requirements related to the intended or specified use. A defect is a part of the software that already exists a...