A Quick Alignment Method for Flying Probe Tester

A flying probe testing machine, fast technology, applied in printed circuit testing, electronic circuit testing, etc., can solve the problems of low production efficiency, CCD camera blindness in finding alignment points, and long time-consuming, etc., to achieve the goal of improving work efficiency Effect

Active Publication Date: 2019-12-27
SHENZHEN MICRONIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] During the testing process of the flying probe tester, the test data is first retrieved, the PCB board is placed, and then the alignment points are aligned with the CCD camera. In most cases, the test data has preset alignment points, and only Check on the PCB board, start to test the board after the check is completed, and take the board after the test is completed; the CCD camera is blind to find the alignment point, and it takes a long time; at the same time, follow-up testing other same PCB boards , the CCD camera still continues to blindly check the alignment points, which takes too long and the production efficiency is low

Method used

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  • A Quick Alignment Method for Flying Probe Tester

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Embodiment Construction

[0020] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0021] see figure 1 , the present invention provides a kind of quick alignment method of flying probe testing machine, and described flying probe testing machine comprises one or more test shafts, wherein, at least one test shaft is provided with test probe and CCD camera, and described alignment The method includes the following steps:

[0022] Step 1: randomly take a PCB board 10 to be tested with a regular shape, and install it in the fixture 1 of the flying probe testing machine;

[0023] Step 2: Get the test data corresponding to the PCB board 10, the test data includes the distance ΔL from the edge of the PCB board 10 to the first alignment point 5 in the X-axis direction, and the test data also includes each Parameters such as the angle and distance between the alignment points, the angle and distance between the CCD camera 3 and the...

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Abstract

The invention discloses a flying probe test machine fast alignment method. A flying probe test machine comprises one or multiple test shafts, wherein at least one test shaft is provided with a test probe and a CCD camera. The coordinates of an alignment point in an X-axis direction can be fast located through the distance from the initial position of the CCD camera to the board side of a PCB and the distance from the board side to the alignment point. The CCD camera moves in the Z-axis direction of the X-axis coordinates of the alignment point so that the alignment point can be fast located and aligned, and then other alignment points can be aligned. The alignment point of the PCB can be fast searched with the board side of the PCB acting as the reference object so that the work efficiency can be effectively enhanced and the labor intensity of the employees can be reduced.

Description

technical field [0001] The invention relates to a circuit board testing method, in particular to a quick alignment method for a flying probe testing machine. Background technique [0002] The flying probe testing machine generally includes four independently movable test shafts, which are distributed on both sides of the PCB board fixture. The test shafts contain test probes, and the test probes are placed on the PCB board to be tested Move and touch the test point within the range of the front and back sides of the test point. The electric test board applies a certain voltage and current to the test point through the test probe to obtain different signal feedback, so as to judge the on-off situation of the PCB circuit to be tested. [0003] During the testing process of the flying probe tester, the test data is first retrieved, the PCB board is placed, and then the alignment points are aligned with the CCD camera. In most cases, the test data has preset alignment points. C...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2808
Inventor 麦伟东王加勇曾建威康敏优黄达许
Owner SHENZHEN MICRONIC TECH
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