Test system and method

Abstract

The invention discloses a test system and method. The system comprises a control device and multiple test devices connected with the control device, wherein the control device is used for sending a test task to all the test devices, and all the test devices are used for testing a tested object according to the received test task; each test device is further used for performing statistical analysis on test data relevant to the test device, obtaining a local statistical result corresponding to the test device and supplying the local statistic result to the control device; and the control device is further used for summarizing the local statistical results supplied by all the test devices and determining test result data of the tested object according to the summarizing result. Through the test system and method, the processing efficiency of the control device is improved, the system resource occupation quantity of the control device is lowered, the quantity of system resources capable of being shared by all the test devices is not influenced, therefore, higher pressure can be exerted according to the tested object, and the property limit of the tested object can be accurately tested.

Description

technical field [0001] The invention relates to the field of communication technology, in particular to a test system and method. Background technique [0002] At present, the test system has been more and more widely used. For example, before the game is officially launched, the performance of the game server needs to be tested through a test system to ensure that the game server can provide users with stable services after the game is officially launched. [0003] A traditional test system usually includes two parts, a control device and a test device, wherein the control device is used to send test tasks to the test device to control the test process of the test device, and the test device is used to test the object under test according to the received test task. Test, and provide the obtained test data to the control device for processing. In addition, in order to improve the concurrency of the testing process, usually multiple testing devices are deployed to perform t...

AI Technical Summary

Problems solved by technology

[0004] However, the inventor found in the process of realizing the present invention that the above-mentioned method in the prior art has at least the following defects: since the test data generated by each test device will be provided to the control device, the control device will perform statistics on the test data Analysis to determine the test results. Therefore, when the control device performs statistical analysis, it is necessary to process massive test data, and the processing of massive data usually takes a long time, so the processing efficiency is low.

In addition, the control device will occupy more system resources in the process of processing massive data. Since the total amount of resources in the entire test system is limited, it will inevitably lead to a reduction in the amount of system resources that each test device can enjoy. Affect the test performance of each test device

For example, in a stress test scenario, when the amount of system resources available to each test device is reduced, the maximum pressure exerted by the entire test system on the object under test will inevitably be reduced, making it impossible to accurately test the performance limit of the object under test

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