A ternary test method and device for wide-range contact thermal resistance

Abstract

The invention provides a wide-threshold contact thermal resistance ternary test method and device. Ternary refers to a surface morphology determination system, a heat conductivity coefficient determination system and a contact thermal resistance experiment element temperature field test system. The method and device can accurately obtain contact surface overall comprehensive roughness comprising surface flatness, and can be directly applied to engineering practice; the method and device accurately obtain heat conductivity coefficients of a sample to be tested under different temperatures and provide accurate data for heat flow postprocessing and calculation; by serving the sample to be tested as a heat flow meter, uncertain errors due to contact thermal resistance between the heat flow meter and the sample to be tested can be prevented, thereby improving test precision; and an anti-radiation super thermal insulation material is provided with a compensating heater, thereby providing guarantee for one-dimensional steady-state method principle. The device and method realize contact thermal resistance measurement of various kinds of materials, of which the gap medium pressure is within 0.01 Pa-1 MPa, contact pressure is 0-50 MPa, and heating end temperature is RT-1500 DEG C.

Description

technical field [0001] The invention belongs to the technical field of testing, and relates to a wide range value contact thermal resistance ternary testing method and device, specifically a contact thermal resistance test based on non-contact surface topography measurement and thermal conductivity measurement of a sample to be tested Methods and devices. Background technique [0002] Contact thermal resistance widely exists in the heat transfer process between two solids in contact with each other. A smooth and flat surface from a macroscopic point of view is composed of a series of continuous small peaks and grooves from a microscopic point of view. In contact with some discrete points or surfaces, the actual contact area usually only accounts for about 1% of the nominal contact area. When the heat passes through the contact interface, the actual contact area is conducted by solid heat conduction, while the non-contact area is conducted by medium heat conduction, radiatio...

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Problems solved by technology

[0004] The purpose of the present invention is to solve the uncertain error caused by contact thermal resistance measurement by means of contact method and contact thermal resistance test in the prior art, and provide a method based on non-contact surface topography measurement. Ternary test method and device for contact thermal resistance with wide range value of thermal conductivity measurement of sample to be tested

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