Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Test system of Type-C interface

A test system and interface technology, which is applied in the field of Type-C interface test systems to save manpower and facilitate automated testing

Inactive Publication Date: 2018-01-05
HUAQIN TECH CO LTD
View PDF9 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is to overcome the defects in the prior art that the operator needs to plug and unplug the Type-C external device multiple times to complete the test when testing the Type-C interface of the electronic device, and provides a Type-C interface test system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test system of Type-C interface
  • Test system of Type-C interface
  • Test system of Type-C interface

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0033] A test system for a Type-C interface, specifically as figure 1 As shown, including relay device 1 and controller 2;

[0034] The transfer device 1 is provided with peripheral interfaces of different transmission types for connecting peripherals with corresponding transmission types, and different peripheral interfaces are used for connecting different pins of the Type-C interface of the device under test;

[0035] The controller 2 is communicatively connected with the relay device 1, and is used to send a switching instruction to the relay device 1, and control the relay device 1 to switch between different peripheral interfaces and connect to different pins of the Type-C interface, To test different pins of the Type-C interface.

[0036] In this embodiment, the 24 pins of the Type-C interface are drawn out using a relay device. Table 1 shows the 24 pins of the Type-C interface. The corresponding peripheral interface connected to the relay device is controlled by the ...

Embodiment 2

[0040] The test system of the Type-C interface of the present embodiment is further improved on the basis of Embodiment 1, the transfer device includes a PCB circuit board, the peripheral interface is arranged on the PCB circuit board, and the peripheral interface Including USB2.0 interface, USB3.1 interface and Audio interface, Table 2 shows the corresponding relationship between front and back USB2.0 interface, front and back USB3.1 interface and front and back Audio interface and different pins of Type-C interface, table The front and back in 2 respectively correspond to the situation that the same type of external device is being inserted into the peripheral interface and reversely inserted into the peripheral interface. In addition, the types of peripheral interfaces are not limited to USB2.0 interface, USB3.1 interface and Audio interface, and interfaces with other functions can also be expanded accordingly, and can be connected with different pins of the Type-C interface...

Embodiment 3

[0047] The test system of the Type-C interface of the present embodiment is further improved on the basis of Embodiment 1, specifically as figure 2 As shown, the test system also includes a test unit 3, the test unit 3 is used to test the pins currently being connected, after the test is completed, the test results are generated and feedback instructions are sent to the controller 2, the Feedback command signifies test completion of the pin currently being connected;

[0048] The controller 2 generates the switching instruction according to the feedback instruction.

[0049] Further, the test unit 3 and the controller 2 are connected through a data line, and the data line is used to transmit the feedback instruction;

[0050]In this embodiment, after the test unit finishes testing the pins currently being connected, a feedback command is generated and sent to the controller, and the controller switches the pin corresponding to the next peripheral interface and the Type-C int...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a test system of a Type-C interface. The system comprises a transfer device and a controller. The transfer device is provided with peripheral interfaces of different transmission types and is used for connecting peripherals of corresponding transmission types, and different peripheral interfaces are used for connecting different pins of a Type-C interface of equipment to betested. The controller is in communication connection with the transfer device and is used for sending a switching command to the transfer device, controlling the transfer device to switch differentperipheral interfaces to connect the different pins of the Type-C interface so as to test different pins of the Type-C interface. According to the system, through adding the transfer device and the controller, when the Type-C interface is tested, the test can be completed without inserting and pulling external equipment of the Type-C interface and without switching of the front and back sides of the peripheral, and the automated testing is facilitated while manpower is saved.

Description

technical field [0001] The invention relates to a testing system for a Type-C interface. Background technique [0002] Type-C is a connection interface of the USB (Universal Serial Bus) interface. It can be inserted regardless of the front or the back. It supports functions such as charging, data transmission, and display output. It is also compatible with USB3.0, USB2.0, etc. The first-generation interface, when performing batch testing on the Type-C interface of electronic devices (including mobile phones, tablet computers, and notebook computers, etc.), the front and back of the Type-C interface must be tested for multiple compatible devices, and the test process requires Testers plug and unplug Type-C external devices multiple times to complete the Type-C interface test, which is not conducive to automated production. Contents of the invention [0003] The technical problem to be solved by the present invention is to overcome the defects in the prior art that the oper...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/01G01R1/04
Inventor 王瑜
Owner HUAQIN TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products