Device and method for testing semi-finished products of short PIN Nixie tubes
A testing device and testing method technology, applied in the field of semi-finished product testing devices of short PIN digital tubes, can solve the problems of abnormal lack of brightness in semi-finished products, difficulty in taking out semi-finished products, difficulty in testing short PIN of digital tubes, etc., so as to avoid abnormal lack of brightness and improve height , the effect of simple operation
Inactive Publication Date: 2018-02-27
JIANGSU WENRUN OPTOELECTRONICS
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Problems solved by technology
[0007] At present, it is difficult to test the short PIN of the digital tube. When the length of the PIN is less than 6.4mm, the semi-finished product will be directly attached to the fixed test fixture due to the short legs when testing the semi-finished product. It is difficult for the operator to take out the semi-finished product and it is easy to touch the welded aluminum. The wire and the fixed chip cause the semi-finished product to be abnormal.
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[0025] Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:
[0026] A semi-finished test device for a short PIN digital tube, such as figure 1 with 2 As shown, it includes a fixed test fixture 1 and a clamping switch. Two pin headers 12 are slidably arranged on the fixed test fixture 1. The two pin headers 12 can slide relative to or opposite to each other. The outer sides of the pin headers 12 A spring 121 is provided, and the spring 121 makes the two needle row female seats 12 have a tendency to slide relative to each other; a trapezoidal distance-changing plate 13 is arranged between the two needle-row female seats 12, and the inside of the needle row female seats 12 and the distance-changing plate 13 The two hypotenuses are adapted, and the end of the distance-changing plate 13 is provided with a limiting plate 131 , and a limiting groove 14 is provided between the two pin headers 12 .
[0027] A scale...
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The invention provides a device and method for testing semi-finished products of short PIN Nixie tubes. The method comprises the following steps that 1, according to the sizes of Nixie tubes to be tested, a variable-distance plate is pushed to make the row distance of two rowed-pin main seats matched with the sizes of the Nixie tubes to be tested, and then a limiting plate on the variable-distanceplate is inserted into a limiting groove; 2, PINs of the Nixie tube to be tested are plugged into rowed needles of the rowed-pin main seats; 3, a clamping switch is turned on and testing is performed. Compared with the operation that original semi-finished products are directly put in a fixing and testing clamp for testing, the device is simpler in operate, tested semi-finished products are moreconvenient to take out, and brightness shortage and abnormity caused by the fact that an operator touches aluminum wires and wafers are avoided.
Description
technical field [0001] The invention relates to the technical field of LEDs, in particular to a semi-finished product testing device and method for a short PIN digital tube. Background technique [0002] Nixie tubes are also called LED digital tubes. People in different industries call them differently, but they are actually the same product. [0003] According to the connection mode of the light-emitting diode unit, it can be divided into a common anode digital tube and a common cathode digital tube. The common anode digital tube refers to the digital tube that connects the anodes of all light-emitting diodes together to form a common anode (COM). When the common anode digital tube is applied, the common pole COM should be connected to +5V. When the cathode of a certain field of light-emitting diodes When the level is low, the corresponding field is lit, and when the cathode of a certain field is high, the corresponding field is not lit. The common cathode digital tube re...
Claims
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IPC IPC(8): G01R31/26G01R31/44
CPCG01R31/2635G01R31/44
Inventor 曹聪
Owner JIANGSU WENRUN OPTOELECTRONICS