Crack defect detection method of EL test of polycrystalline silicon solar cell

A solar cell and defect detection technology, which is applied in photovoltaic power generation, electrical components, photovoltaic system monitoring, etc., can solve the problems of greater influence of subjectivity, increase of enterprise cost, and influence of production efficiency, etc.

Inactive Publication Date: 2018-02-27
HEBEI UNIV OF TECH +1
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Problems solved by technology

[0003] At this stage, the domestic mainly relies on artificial naked eyes to identify these defects, which is greatly affected by subjectivity, and will increase the cost of enterprises and affect the efficiency of production

Method used

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  • Crack defect detection method of EL test of polycrystalline silicon solar cell

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Embodiment Construction

[0043]The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0044] refer to figure 1 as shown, figure 1 It is a flowchart of the detection method of the present invention;

[0045] A method for polycrystalline silicon solar cell EL test crack defect detection, the method includes three step units:

[0046] The first step, the image preprocessing unit

[0047] 1-1 Obtain grayscale image: convert the RGB image information collected by the industrial infrared camera into grayscale image information;

[0048] 1-2 Obtain...

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Abstract

The invention discloses a crack defect detection method of an EL test of a polycrystalline silicon solar cell. The detection method is applicable to industrial production solar cell sites. The detection method comprises the steps that collected images are preprocessed, global threshold segmentation and opening operation and closing operation of morphology are conducted to suppress interference ofa non-processing area; then median filtering and guide filtering are conducted to remove image noise; a probe area is extracted through threshold differentiation and feature extraction, the probe areaand an area formed after threshold segmentation are subjected to complementary operation, the probe area is eliminated, and the area to be detected is remained; the smoothed images are subjected to Fourier transformation; the probe area and the area subjected to Fourier transformation are eliminated, intersection is conducted to obtain the area to be detected, lines of the area to be detected areextracted, and then whether or not the lines are cracks is judged according to the attribute of the lines. The crack defect detection method achieves non-contact detection, improves the detection quality and efficiency, effectively lowers the debris rate of the detection process, and can effectively achieve on-line automation of detection.

Description

technical field [0001] The invention relates to the technical field of photovoltaic cell detection, and mainly relates to a method for detecting crack defects in EL testing of polycrystalline silicon solar cells. Background technique [0002] With the development of our country's economy, the consumption and demand of resources continue to grow, and now our country's economy is facing a critical moment of economic transformation and upgrading, and the energy problem has become another major problem hindering the development of our country's national economy. As a new renewable clean energy, solar energy has become the fastest-growing and most dynamic research field in recent years because of its good availability. Polycrystalline silicon solar cells are widely used in photovoltaic power generation. The production process of the photovoltaic industry is complex, and there are often color differences or the produced cells will have defects such as broken grids, cracks, low ef...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11G06T7/136G06T7/155G06T5/00H02S50/10
CPCG06T5/002G06T7/0004G06T2207/20032G06T2207/30148G06T7/11G06T7/136G06T7/155H02S50/10Y02E10/50
Inventor 刘坤闫皓炜李爱梅韩江锐文熙陈海永王玉崔海根樊雷雷胡洁于矗卓
Owner HEBEI UNIV OF TECH
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