A method for detecting the appearance of dirty defects of polycrystalline silicon solar cells
A technology for solar cell and defect detection, applied in circuits, electrical components, semiconductor/solid-state device testing/measurement, etc., can solve problems such as increased production costs, uneven image texture, and detection difficulties.
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[0032] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0033] refer to figure 1 As shown, the present invention claims a method for detecting the appearance of a solar cell surface dirty defect, the method includes two steps:
[0034] The first step is to preprocess the image
[0035] 1-1 Calibrate the camera to eliminate distortion;
[0036] 1-2 Convert to a single-channel image: convert the RGB three-channel image collected by the industrial camera into an R, G, B single-channel image;
[0037] 1-3 Rotate and...
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