Progressive damage model-based full-SiC composite material multi-nail connection structure failure analysis method
A composite material and connection structure technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of staying, C/SiC composite material joints are rare, etc., to reduce the test cost and the model form is simple Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0080] Example 1: Failure analysis of C / SiC composite multi-nail connection structure
[0081] like image 3 As shown in (a), the C / SiC composite multi-nail connection structure connects the upper plate and the lower plate through bolts, and the composite plate and bolts used are both made of C / SiC material. Firstly, the C / SiC substrate was fabricated by the CVI process, and the connecting plate and bolts were cut out from the substrate, and the bolts and the connecting plate were manually tightened and installed, and the tightening torque was about 0.3N·m. like image 3 As shown in (b), the bolt weaving plane is parallel to the direction of the bolt shank.
[0082] 1. According to the structural parameters of C / SiC composite multi-nail connection joints, a three-dimensional finite element model of the structure was established in the finite element software ABAQUS, and the free end of the upper laminate was completely constrained, and a displacement load in the x direction ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com