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An infrared camera wave band comparison method based on detection efficiency

An infrared camera and waveband technology, which is applied in the field of infrared detection and can solve the problems of only considering the background characteristics of the target, but not considering the performance of the detector.

Active Publication Date: 2018-04-10
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

At present, the common method has two shortcomings. One is that only the background characteristics of the target are considered in the process of band analysis, and the performance of the detector used in the specific engineering implementation is not considered; the other is that only the distribution is considered when considering the influencing factors. The influence of each factor, without combining the influencing factors for comprehensive analysis

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  • An infrared camera wave band comparison method based on detection efficiency
  • An infrared camera wave band comparison method based on detection efficiency
  • An infrared camera wave band comparison method based on detection efficiency

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Embodiment Construction

[0049] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings, but it is not limited thereto. Any modification or equivalent replacement of the technical solution of the present invention without departing from the spirit and scope of the technical solution of the present invention should be covered by the present invention. within the scope of protection.

[0050] The specific implementation of the method will be described below by taking the selection of an aircraft target tracking band as an example. The two long-wave bands selected for comparison are 8-12 μm and 8-10 μm respectively.

[0051] 1. Target and background simulation

[0052] The temperature of a target gradually decreases with time during the flight process. The typical operating temperature is about 590K, and the emissivity is about 1. Using the Planck formula for simulation, the results are as follows figure 2 shown.

[0053] Since the...

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Abstract

The invention provides an infrared camera wave band comparison method based on detection efficiency. The method comprises the steps of: firstly, performing simulation on target radiation characteristics and atmospheric background radiation characteristics; secondly, performing target and background electron number calculation based on actually adopted optical system and detector parameters; thirdly, performing detection interference electron number calculation based on detector properties; fourthly, calculating detection efficiency parameters under different wave bands as reference for wave band selection. The invention provides the systematic method for wave band selection of a space-based infrared detection system shouldering specific tasks; the method closely fits engineering practice and the evaluation indexes are quantifiable, so that reference is provided for design of wave bands of a space-based infrared detection system.

Description

technical field [0001] The invention belongs to the field of infrared detection, and relates to an infrared camera band comparison method combined with detector performance and target background characteristics, which is applied to the selection and design of bands in the design of infrared detectors. Background technique [0002] During the design process of the detection system, the selection of the band has a great impact on the detection performance, and to a certain extent determines whether the detection system can detect the target in time and achieve continuous tracking of the target. The appropriate detection band should highlight the detection target on the basis of suppressing the background, and the influencing factors include target background radiation energy, atmospheric influence, imaging optical system and detector influence. At present, there is no authoritative model and unified evaluation standard for the selection of detector bands. The usual method is t...

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Application Information

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IPC IPC(8): G01J5/00
CPCG01J5/00
Inventor 饶鹏谢婧李夜金
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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