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12 results about "Electron number" patented technology

In an atom, the number of electrons and protons are equal, meaning electron number is also 8. mass number 16. Mass number is the number of nucleons (neutrons + protons) in an atom, therefore, Neutron number = 16 - 8 = 8.

Electron gun drive power supply

PCT designated stageWO2026005025A1X-ray tube detailsParticle physicsQuantum electrodynamics
An electron gun drive power supply 30 drives an electron gun including a cathode electrode 5 that emits electrons E, an adjustment electrode 7 that adjusts the amount of the electrons E to be emitted from the cathode electrode 5, and an extraction electrode 8 that extracts the electrons E from the cathode electrode 5. The electron gun drive power supply comprises a potential switching unit 16 that switches between a state in which the potential of the cathode electrode 5 is lower than the potential of the extraction electrode 8 and a state in which the potential of the cathode electrode 5 is higher than or equal to the potential of the extraction electrode 8. The electron gun drive power supply 30 can rapidly switch between an ON state in which a target is irradiated with the electrons and an OFF state in which the target is not irradiated with the electrons.
Owner:HAMAMATSU PHOTONICS KK

X-ray generator

ActiveJP2026006101AX-ray tube detailsParticle physicsElectron number
To provide an X-ray generator capable of avoiding damage to a target even when discharge occurs between a cathode electrode and an adjustment electrode.SOLUTION: An X-ray generator 1 includes a cathode electrode 5 that emits electrons E, an adjustment electrode 7 that adjusts an emission amount of the electrons E from the cathode electrode 5, an extraction electrode 8 that extracts the electrons E from the cathode electrode 5, a target 9 that generates an X-ray R by incidence of the electrons E, a discharge detection unit 15 that detects discharge between the cathode electrode 5 and the adjustment electrode 7, and a potential switching unit 16 that sets a potential of the extraction electrode 8 to be higher than a potential of the cathode electrode 5 during a normal operation and sets the potential of the extraction electrode 8 to be equal to or lower than the potential of the cathode electrode 5 during discharge detection.SELECTED DRAWING: Figure 1
Owner:HAMAMATSU PHOTONICS KK

A fractal dimension calculation method and a general detection device based on electron density and distribution uniformity

PendingCN122455168AValence electronElectron density
The application discloses a kind of based on electronic density and distribution uniformity Fractal dimension calculation method and general detection device, belong to material microstructure characterization technical field.The method determines material chemical formula unit total price electron number, theoretical dense density and molar mass, detects actual density and calculates porosity;Collect surface topography gray data, calculate electronic distribution uniformity by normalized variance;Total price electron number density is calculated, combined with fitting proportion coefficient, and the fractal dimension is obtained by general formula.The detection device uses modular architecture, including basic parameter input, density detection, uniformity acquisition, main control calculation and result output module, each module can be independently replaced, and the main control module is built-in core algorithm.The application does not need large microscopes, realizes fast, low-cost detection, adapts to various solid materials, wide protection range, easy industrialization, solves the problems of high cost, complicated process, poor universality and easy to avoid in prior art.
Owner:薛梁

Active space determination program, active space determination method, and information processing device.

The goal is to automate the determination of the active space, which is useful for quantum chemical calculations. [Solution] The active space determination program obtains occupancy data, which includes data showing the time-series changes in the number of electrons occupied in each of multiple molecular orbitals. Using the occupancy data as input, the program calculates the solution to a mathematical optimization model formulated with constraints that keep the sum of the number of electrons occupied in multiple molecular orbitals constant, and an objective function that gives a relatively higher evaluation to combinations of molecular orbitals whose time-series changes in the number of electrons occupied are negatively correlated with combinations whose time-series changes in the number of electrons occupied when selecting a subset from multiple molecular orbitals to be used in quantum chemical calculations, compared to combinations whose time-series changes in the number of electrons occupied are positively correlated. The program then has the computer execute the calculation and output the result.
Owner:FUJITSU LTD

vacuum tubes

ActiveJP2026044467AMultiplier cathode arrangementsSecondary-electron emitting electrode tubesElectron multiplicationElectron multiplier
To provide an electron tube that can appropriately make electromagnetic waves having a predetermined electric field oscillation direction incident on an electron emission section and can appropriately multiply electrons emitted from the electron emission section in response to the incidence of the electromagnetic waves having the predetermined electric field oscillation direction. [Solution] The electron tube (1) comprises an electron emitter (3) including a metasurface (32) that emits electrons in response to incidence of an electromagnetic wave (W) having a predetermined electric field oscillation direction (V), an electron multiplier (4) that multiplies the electrons emitted from the electron emitter (3), and a first mesh electrode (5) arranged between the electron emitter (3) and the electron multiplier (4). The first mesh electrode (5) includes a plurality of wires (52) that define a plurality of openings aligned in a first direction (D1) parallel to the electric field oscillation direction (V). When viewed from the propagation direction (T) of the electromagnetic wave (W), each of the plurality of openings has an elongated shape whose longitudinal direction is a second direction (D2) that intersects with the first direction (D1) at an angle of 45 degrees or more.
Owner:HAMAMATSU PHOTONICS KK +1

An element concentration detection method based on laser-induced breakdown spectroscopy

The application discloses an element concentration detection method based on laser-induced breakdown spectroscopy, and belongs to the technical field of laser spectrum analysis. The method comprises the following steps: acquiring plasma electron temperature, electron number density and element interference in LIBS of an unknown sample, and then acquiring energy and area of a plasma acoustic spectrum image corresponding to the unknown sample; inputting five features corresponding to the unknown sample into a mapping relationship to obtain a standard spectrum deviation, so as to correct an actual spectrum of a spectrum line to be corrected and obtain a corrected spectrum after elimination of a matrix effect; and finally, substituting the corrected spectrum into a calibration curve to obtain an element concentration after elimination of the influence of the matrix effect. The application summarizes main factors influencing spectral intensity due to the matrix effect, extracts features from LIBS and a plasma acoustic spectrum image, performs fitting and correction on the deviation of each spectrum, and has the advantages of clear physical meaning, no need for pretreatment, no need for complicated parameter adjustment, low cost and small amount of calculation compared with existing methods.
Owner:HUAZHONG UNIV OF SCI & TECH

Electric arc reignition determination method and device, computer equipment and storage medium

The invention relates to an arc reignition determination method and device, computer equipment and a storage medium, and the method comprises the steps: obtaining a target space-time coordinate point of a vacuum circuit breaker after the vacuum circuit breaker cuts off a circuit of a power system; wherein the target space-time coordinate points comprise time coordinates and space coordinates, the time coordinates correspond to different moments in the post-arc medium recovery process, and the space coordinates correspond to different positions in the electrode gap of the vacuum circuit breaker; inputting the target space-time coordinate point into a target simulation model to obtain a target simulation physical quantity; wherein the target simulation physical quantity comprises at least one of potential, electron number density, ion number density and electron temperature; and determining a reignition evaluation result of the arc according to the target simulation physical quantity. According to the scheme, the target time-space coordinate point is input into the target simulation model, so that the target simulation physical quantity can be quickly obtained, and massive particles do not need to be simulated, thereby improving the simulation efficiency.
Owner:GUANGDONG POWER GRID CO LTD +1

METHOD FOR SIMULATING THE BEHAVIOR OF A PHYSICAL SYSTEM

ActiveDE102024112013B4Quantum computersSpin systemPhysical system
A method for simulating the behavior of a physical system using a quantum computer comprising a plurality of qubits, wherein the qubits are first evaluated with respect to their system properties and categorized into high-performance qubits and low-performance qubits, wherein the physical system is described in a Hilbert space spanned by orbitals, and the spin-like system is assigned to the high-performance qubits during a mapping process, the behavior of the physical system is simulated using the qubits of the quantum computer, and physical observables of the physical system are determined by measurements of the qubits of the quantum computer, characterized in that, in an identification step, spin-like linear combinations of orbitals in the physical system are identified, and these are spin-like orbitals in the spin-like system.which, in addition to other remaining orbitals, span the Hilbert space, wherein the physical system thus described is transformed such that, after the transformation, changes in the number of electrons and / or the electron density on the spin-like orbitals are reduced or completely eliminated, and the transformed physical system is then described on a Hilbert space spanned only by the orbitals identified as spin-like.
Owner:HQS QUANTUM SIMULATIONS GMBH

Variational quantum eigen-solving method and device based on physical symmetry, medium and equipment

The application relates to the technical field of quantum computing and quantum chemistry cross, and particularly discloses a variational quantum eigen solution method, device, medium and equipment based on physical symmetry, which comprises the following steps: obtaining target system information, wherein the target system information comprises a Hamiltonian of a target system, the number of electrons, orbital energy distribution and symmetry; reducing the Hamiltonian based on the number of electrons and the orbital energy distribution, converting the reduced Hamiltonian from a fermion operator form into a Pauli operator form to obtain a Pauli Hamiltonian; determining a variational quantum circuit based on the symmetry; and solving the Pauli Hamiltonian based on the variational quantum circuit to obtain the ground state energy of the target system. The application solves the problem that the number of quantum computing bits is difficult to adapt to a large chemical system.
Owner:KEYING FUTURE (SHANGHAI) INTELLIGENT TECHNOLOGY CO LTD

A laser containing a population inversion structure

The application discloses a laser containing a particle number inversion structure, which comprises, from bottom to top, a substrate, a lower limiting layer, a first lower waveguide layer, a second lower waveguide layer, an active layer, an upper waveguide layer and an upper limiting layer; the first lower waveguide layer and the second lower waveguide layer form a lower waveguide layer; the upper limiting layer, the upper waveguide layer, the active layer, the first lower waveguide layer and the second lower waveguide layer form a particle number inversion structure; in the particle number inversion structure, the upper waveguide layer steep Mg-doped concentration interface, the active layer steep Si-doped concentration interface, the lower waveguide layer steep Si-doped concentration interface, the upper waveguide layer steep Al content interface and the lower waveguide layer steep Al content interface jointly make the electron number of the active layer much larger than the hole number, thereby forming particle number inversion; with continuous input of an excitation source, hole radiation recombination is greater than loss, laser generation is accelerated, the threshold of the laser is reduced, and laser power and efficiency are improved.
Owner:GEN SEMICONDUCTOR (ANHUI) CO LTD

Method of operating a particle beam system, particle beam system, non-transitory storage medium and program

A method of operating a particle beam system comprises positioning a sample at a given distance away from a lens focusing a particle beam; performing a measurement for each selected energization of a plurality of measurement energizations, wherein each measurement comprises recording a value derived from a reading of an electron detector, while the lens is energized with a selected measurement energization; and analyzing a dependency of the recorded values from the plurality of measurement energizations. Herein analyzing is based on a dependency of the number of electrons incident on the electron detector per unit time from the distance of the sample from the lens and from the energization of the lens.
Owner:CARL ZEISS MICROSCOPY GMBH

A method for determining a micro-discharge threshold of a microwave component

ActiveCN117454599BSolve the phase coupling relationshipSolve the problem of simulation phase deviationTesting dielectric strengthDesign optimisation/simulationMicrowaveSecondary electrons
A kind of microwave component micro-discharge threshold determination method, comprising the following steps: (1) seed electron state initialization;(2) analysis microwave component internal electromagnetic field;(3) set time step, promote electron operation trajectory;(4) determine whether electron collides with microwave component surface, if not collide return (3);(5) calculate the energy, angle and electron and material interaction time of emitted secondary electron;(6) update electron state;(7) determine whether electron reaches the set simulation period;(8) according to the trend of electron number change with time determine whether micro-discharge occurs.The method more objectively and accurately characterizes the physical process of micro-discharge effect occurrence under high frequency, and can be used for the anti-micro-discharge design of high frequency microwave component.
Owner:XIAN INSTITUE OF SPACE RADIO TECH