The invention discloses a
voltage Trim test method combining full-value
simulation and a dichotomy, and relates to the technical field of
semiconductor testing, an initial trimming code value is determined through a table look-up method according to a pre-stored trimming code value and
voltage mapping relation, a trimming code value subset is delimited by taking the initial trimming code value as a reference, and the trimming code value subset is determined by taking the initial trimming code value as a reference; a target trimming code value is determined within the range of the subsets through a precise search method, the precise search method comprises two implementation
modes of a full-value
simulation method and a dichotomy, the full-value
simulation method executes a microinstruction test pattern through an HDCTO board card, all trimming code values written into the subsets are traversed,
voltage data are synchronously collected, and the target trimming code value is determined through the dichotomy; according to the
bisection method, the target value is rapidly converged through iterative calculation of an intermediate value, measurement comparison and interval updating, the rapid positioning
advantage of a table look-up method and the high accuracy
advantage of an accurate search method are fused, and the balance of high accuracy and low
time cost is achieved while it is guaranteed that the test accuracy is remarkably improved.