The present invention belongs to the field of power
semiconductor technology and relates to an adaptive high-
voltage and low-loss power device. Compared with the traditional LIGBT structure, the present invention introduces an adaptive PMOS structure at the
anode end of the LIGBT, and the gate of the PMOS structure is controlled by an integrated
diode. When forward-conducting, the PMOS channel is closed, and the
electron extraction path is blocked, thereby eliminating the
snapback effect. During the shutdown process, as the
anode voltage rises, the LIGBT
anode PMOS channel is adaptively turned on, and the electrons in the drift region are converted into holes by the
electrode 11, and then extracted from the P+ collector region through the PMOS channel; at the same time, the P+ collector region and the N-type buffer layer are almost short-circuited at the same potential, which inhibits the P+ collector region from injecting holes into the drift region, and the two jointly accelerate the shutdown of the device to reduce the shutdown loss. During forward blocking, the hole current in the P+ collector region is converted from the
electrode 11 to the
electron current and injected into the drift region through the PMOS channel, forming a MOS-like breakdown mode, which increases the
breakdown voltage. Therefore, the present invention has smaller shutdown losses and higher breakdown voltages.