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116 results about "Channel density" patented technology

Density channel. A channel used to investigate a density current; for example, in experiments relating to the behavior of cold masses of air in the atmosphere and related frontal structures.

Grooved gate short circuit anode SOI LIGBT

The invention belongs to the technical field of power semiconductors and relates to a grooved gate short circuit anode SOI LIGBT. In comparison with the traditional short circuit anode LIGBT, anode grooves connected to anode potential are introduced at an anode end, and a P body area is introduced right below an N+ anode area; and grooved gates and cathode grooves connected with a cathode are introduced in a cathode area. When the device is turned off, the anode groove is connected to high potential, an NMOS in the anode area is started automatically, extraction of electrons stored in a driftarea is quickened, and the turn-off time and the turn-off energy loss are reduced; when the device is in a high-voltage high-current state, the cathode groove forms a hole bypass, and happening of latch-up effects is suppressed; when the device is conducted, under blocking of an electronic barrier in the P body area, electron current in the drift region is not easy to be collected by the N+ anode,voltage reentry effects are eliminated, and as the grooved gate structures of the cathode are in parallel connection, the channel density is increased and the conduction voltage drop is reduced. Thegrooved gate short circuit anode SOI LIGBT has the beneficial effects that in comparison with the traditional short circuit anode LIGBT, a voltage reentry phenomenon is eliminated under a smaller transverse cell size, and the conduction voltage drop is lower.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Three-gate power LDMOS

The invention belongs to the field of power semiconductor devices, and relates to a lateral three-gate power LDMOS based on a bulk silicon technology. The three-gate power LDMOS is mainly characterized by having a three-gate structure and a second conductive material electrically connected with a source or a gate or an external electrode. The three-gate power LDMOS has the main advantages that the three-gate structure increases the channel density and reduces the channel resistance, and thus, the specific on-resistance drops; the second conductive material can freely select the electrode, when the gate electrode is connected, in the positive case, electron accumulation surfaces are formed on the side surface and the bottom surface of a second groove, a multi-dimension low-resistance channel is formed, and the specific on-resistance is greatly reduced, and in the reverse case, assistant depletion of a drift region is carried out, the drift area doping concentration of the device is increased, the specific on-resistance of the device is reduced; when the source electrode is connected, gate-drain overlapping is reduced, the gate-drain capacitance of the device is reduced, and switching loss is reduced; and when the external electrode is electrically connected, multiple effects can be achieved.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

IGBT with self-biased separation gate structure

The invention belongs to the technical field of power semiconductor devices, and relates to a separation gate TIGBT with a self-biased PMOS and a manufacturing method thereof. According to the invention, a PMOS structure is introduced on the basis of a traditional TIGBT; the channel density is not reduced; saturation current during forward conduction of the device is effectively improved, the short-circuit safety working capability of the device is improved, and meanwhile, an extra current discharge path provided by the PMOS structure accelerates the hole extraction speed of the device in a blocking state, so that the switching speed of the device is increased, and the switching loss of the device is reduced. Meanwhile, for the TIGBT with an N-type charge storage layer, a P-type buried layer can shield the influence of the N-type charge storage layer on the breakdown characteristic of the device; therefore, the doping concentration of the N-type charge storage layer can be improved tofurther improve the carrier distribution during forward conduction of the device, the conductivity modulation capability of a drift region is improved, and the compromise relationship between the forward conduction voltage drop Vce (on) and the turn-off loss Eoff of the device is further improved.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Optical-level quartz crystal temperature-variable temperature difference method growth technique

The invention discloses an optical level quartz crystal temperature-changing temperature differential method growth technology, comprising the following steps that: firstly, raw materials of seed crystal and quartzite are washed, deionized water and a growth-promoting media are prepared, and a high-pressure autoclave is washed by ionized water and is drained off by a membrane pump; secondly, a raw material basket holding the quartzite is put in the washed autoclave, the prepared grow-promoting media and a seed crystal bracket hung with the seed crystal are poured into the autoclave, the liquid level is measured, and the autoclave opening is sealed; thirdly, a temperature control system is started, the high-pressure autoclave is heated, the parameters of temperature, pressure and time of the sealed high-pressure autoclave are adjusted so that the quartz crystal is grown and formed. The optical level quartz crystal temperature-changing temperature differential method growth technology is characterized by determining the lineage grade of the seed crystal, the a equivalent concentration of the grow-promoting media, the parameter of a filling degree of the autoclave, the temperature changing and differential parameter and the pressure parameter of the heated high-pressure autoclave. According to the quartz crystal produced by the technology, the lineage index is more than the grade A, the etch channel density is less than 10 strips per centimeter<2>, the value of Q is more than or equal to 3.0x10<6>, an inclusion is higher than the Ia type, the optical uniformity delta n is less than or equal to 5x10<-6>, and the spectrum transmission ratio is more than 95 percent when the wavelength is between 800 and 2, 500 nanometers.
Owner:刘盛浦

Thin silicon-on-insulator (SOI) lateral insulator gate bipolar transistor (LIGBT) with folded groove gate

InactiveCN109887998ASimple processHigh saturation working currentSemiconductor devicesChannel densityElectron injection
The invention belongs to the technical field of a power semiconductor, and particularly relates to a thin silicon-on-insulator (SOI) lateral insulator gate bipolar transistor (LIGBT) with a folded groove gate. The thin SOI LIGBT is mainly characterized in that a non-equal deep dielectric groove and the folded groove gate are employed; during positive voltage resistance, a transverse electric fieldis modulated by the non-equal deep dielectric groove, and a uniformly-doped drift region bears high voltage; during positive conduction, air is prevented from flowing to an emitter by the dielectricgroove, the hole concentration of a drift region near to the emitter is improved, electron injection improvement effect is achieved, and the conduction voltage drop of the device is reduced; the concentration of the drift region near to one side of a collector is farther lower than the concentration of the drift region at one side of the collector of a traditional thin SOI layer linear doping device, and the injection efficiency of the collector is improved; the electrical conduction modulation effect of the device is improved, the positive conduction voltage drop is reduced, the channel density of the folded groove gate is improved, and the saturation current capability of the device is greatly improved. Compared with a traditional thin SOI LIGBT structure, the thin SOI LIGBT has the beneficial effects of lower positive conduction voltage drop and higher saturation current capability, and Von-Eoff is more excellent in difference.
Owner:UNIV OF ELECTRONIC SCI & TECH OF CHINA

High-speed and low-loss multi-trench gate high-voltage power device

The invention belongs to the technical field of power semiconductors and particularly relates to a high-speed and low-loss multi-trench gate high-voltage power device. Compared with a traditional structure, the structure of the high-speed and low-loss multi-trench gate high-voltage power device has the advantage that a plurality of trench gate structures are introduced into an emitter terminal anda collector terminal. Channels in side walls of trench gates at the collector terminal are turned off and a connection path of an N+ collector region and an N-type buffer layer is blocked during forward conduction, so that the voltage foldback effect can be eliminated. A trench gate structure at the emitter terminal can increase the channel density to reduce the resistance of a channel region, and a barrier trench gate and a carrier storage layer can effectively improve the carrier concentration of a drift region, so that the novel device can obtain lower forward conduction voltage drop. In the turn-off process, the channels in the side walls of the trench gates at the collector terminal are opened along with voltage rise of a collector, so that the N+ collector region communicates with the N-type buffer layer to form a rapid electron extraction path and turn-off of the device is accelerated to reduce the turn-off loss. Therefore, the high-speed and low-loss multi-trench gate high-voltage power device has lower forward conduction voltage drop and smaller turn-off loss and does not have the voltage foldback effect.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA +1

High-performance optical fiber interconnection system

The invention provides a high-performance optical fiber interconnection system. The high-performance optical fiber interconnection system comprises a PAM4 electrical interface, a gearbox, an NRZ optical transmitting and receiving unit and an NRZ signal optical path. An electrical port of the system is N / 2 (N is an even number greater than or equal to 2) PAM4 signals, an optical port of the system is N NRZ signals, and a receiver and a transmitter can process NRZ optical path signals more easily, so that a high-performance interconnection system is realized. Optical path interfaces of a receiver and a transmitter of the system are N paths of NRZ signals, but electric ports are N / 2 paths of PAM4 signals, so that the port density is improved. According to the system, a traditional 100G SFP interface can be transformed into a next-generation 100G DSFP or SFP-DD interface, the communication channel density and rate are doubled, and meanwhile, the system is downwards compatible with the SFP interface. The 100G SR2AOC active optical cable using the optical fiber interconnection system is composed of a multimode optical fiber, a gearbox, an NRZ receiving and transmitting machine and an optical device. The active optical cable can be compatible with a DSFP / SFP-DD packaging technology applied by a next-generation data center, and two paths of parallel 2 * 50Gbps PAM4 signal photoelectric transmission are realized. The optical communication system can realize multiplexing of the PAM4 mode and the NRZ mode. The electrical interface can be in a PAM4 mode or an NRZ mode by switching a switch of the gearbox.
Owner:WINGCOMM CO LTD

Silicon carbide power device and preparation method thereof

The invention discloses a silicon carbide power device and a preparation method thereof. The device is a silicon carbide MOSFET of a longitudinal structure and comprises a drain electrode, an N + type silicon carbide substrate, an N-type drift layer, an N type JFET region and a channel region which are sequentially arranged from bottom to top, the N type JFET region and the channel region form a fin-type structure, and the two sides of the N type JFET region and the channel region are each provided with a gate structure; a P-type shielding region is arranged at the bottom of the gate structure, or the P-type shielding region surrounds the bottom of the gate structure and is far away from the outer side of the fin-type structure; an N + type surface region is arranged on the channel region, and a source electrode in ohmic contact with the N + type surface region and the surface of a part of the P type shielding region is arranged on the N + type surface region; and the drain electrode is in ohmic contact with the lower surface of the N + type silicon carbide substrate. According to the silicon carbide power device, the well grounded P-type shielding region is manufactured to shield the gate dielectric layer, and meanwhile, the low-doped depletion channel region which does not need to be grounded is introduced, so that the channel mobility and the channel density are further improved, and the on resistance of the device is reduced.
Owner:PEKING UNIV
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