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Circuit for improving measurement sensitivity of working point and method

A sensitivity and operating point technology, applied in the field of charged particle accelerators, can solve problems such as beam disturbance, achieve the effect of easy circuit structure, simple scheme principle, and improved detection sensitivity

Inactive Publication Date: 2018-04-13
UNIV OF SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to provide a circuit and method for improving the measurement sensitivity of the working point, which can effectively improve the detection sensitivity of the working point, so as to solve the adverse effects of disturbing the measurement of the beam current in the existing measurement technology

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  • Circuit for improving measurement sensitivity of working point and method
  • Circuit for improving measurement sensitivity of working point and method
  • Circuit for improving measurement sensitivity of working point and method

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Embodiment Construction

[0017] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0018] In the electronic storage ring of synchrotron radiation source, the working point measurement system is an essential part. The operating point is obtained by measuring the spectrum of the beam oscillation signal. The common method is to directly collect the beam signal for spectrum analysis. Since the beam signal is a narrow pulse modulation signal, the main frequency component in the beam signal is the cyclotron frequency, and the freque...

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Abstract

The invention discloses a circuit for improving measurement sensitivity of a working point and method. The related circuit comprises a beam position detector, envelope demodulation circuits, AC couplers, a high-resistance differential amplifier, a notch filter and a bandpass filter, wherein each of the two output ends of the beam position detector is connected with one envelope demodulation circuit respectively; the output end of each envelope demodulation circuit is connected with one AC coupler; the output ends of the two AC couplers are correspondingly connected with a reverse input end anda forward output end of the high-resistance differential amplifier respectively; the output end of the high-resistance differential amplifier is connected with the notch filter; and the output end ofthe notch filter is connected with the bandpass filter. The scheme has a simple principle; the circuit structure is easy to build; and in comparison with the conventional working point measurement method, the working point frequency detection sensitivity can be greatly improved, and the method is particularly suitable for real-time working point detection and parameter feedback in a synchrotron radiation light source electronic storage ring.

Description

technical field [0001] The invention relates to the technical field of charged particle accelerators, in particular to a circuit and a method for improving the measurement sensitivity of an operating point. Background technique [0002] The operating point is one of the most important parameters of the electron storage ring of a synchrotron radiation source. In conventional measurement methods, it is usually necessary to apply a certain excitation to the storage beam to effectively detect the operating point, and the disturbance of the beam makes the measurement of the operating point very limited in application. The limit diffraction storage ring proposed in recent years is the most advanced synchrotron radiation light source. Its emittance is usually tens of picometer radians, the stability of the beam trajectory is usually required to be on the order of hundreds of nanometers, and the dynamic aperture is significantly smaller than that of the third-generation light source...

Claims

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Application Information

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IPC IPC(8): G01T1/29
CPCG01T1/29
Inventor 杨永良吴芳芳孙葆根卢平
Owner UNIV OF SCI & TECH OF CHINA
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