Infrared Calibration Light Source Applied in Vacuum and Low Temperature Conditions

A vacuum low temperature, calibration technology, applied in the field of calibration and calibration, infrared radiation measurement, can solve the problem of few calibration points

Active Publication Date: 2019-07-09
BEIJING ZHENXING METROLOGY & TEST INST
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] The purpose of the present invention is to overcome the deficiencies of the prior art, and provide an infrared calibration light source applied under vacuum and low temperature conditions, which can solve the problem of few calibration points in the traditional orbital radiation parameter calibration process

Method used

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  • Infrared Calibration Light Source Applied in Vacuum and Low Temperature Conditions
  • Infrared Calibration Light Source Applied in Vacuum and Low Temperature Conditions
  • Infrared Calibration Light Source Applied in Vacuum and Low Temperature Conditions

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Embodiment Construction

[0030] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, for purposes of explanation and not limitation, specific details are set forth in order to provide a thorough understanding of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details.

[0031] It should be noted here that, in order to avoid obscuring the present invention due to unnecessary details, only the device structure and / or processing steps closely related to the solution according to the present invention are shown in the drawings, and the steps related to the present invention are omitted. Invent other details that don't really matter.

[0032] The embodiment of the present invention provides an infrared calibration light source applied under vacuum and low temperature conditions. The in...

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Abstract

An infrared calibration light source applied under vacuum and low temperature conditions. The infrared calibration light source mainly includes a casing and a mechanical installation interface, a blackbody radiation surface, a support structure, a vacuum packaging window, and a power supply line. The blackbody radiation surface is placed in a casing, and the casing The top of the body has a circular diaphragm above the black body radiation film, the black body radiation surface is parallel to the plane where the diaphragm is located, and the housing is provided with holes for passing through the power supply line. The outer surface of the housing has a higher emissivity, and the inner surface has a higher emissivity. Low emissivity, the side of the black body radiation film facing the diaphragm is used as the black body radiation surface, which has high emissivity and is used to emit infrared radiation; the other side of the black body radiation film has low emissivity, and the supporting structure adopts high temperature resistance and low thermal conductivity Made of high-efficiency ceramic material, the power supply circuit is used to supply power to the black body radiation surface, thereby controlling the temperature of the black body radiation surface.

Description

technical field [0001] The invention relates to the technical field of infrared radiation measurement, calibration and calibration, in particular to an infrared calibration light source applied under vacuum and low temperature conditions. Background technique [0002] At present, with the development of technology, the application of infrared imagers has been extended to near space and outer space. With the gradual improvement of the technical and tactical performance requirements of these infrared payloads, high-precision quantitative detection has become an inevitable trend for the further development of infrared payloads. [0003] Radiation parameter calibration is the basis and prerequisite for quantitative detection of infrared loads. Through radiation parameter calibration, the radiation value of the target can be quantitatively detected, so that the infrared load can judge the type of target through the radiation value, which greatly improves the infrared load. The d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/52G01J5/08
CPCG01J5/0896G01J5/80G01J5/53
Inventor 张玉国吴柯萱孙红胜魏建强宋春晖
Owner BEIJING ZHENXING METROLOGY & TEST INST
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