Infrared-visible light dual-band photoelectric detection system and axis angle error measuring method

A photoelectric detection and dual-band technology, applied in the optical field, can solve problems such as unusable, susceptible to environmental interference, performance discount, etc., and achieve the effect of reducing mass and volume, high-resolution imaging, and simple structure

Inactive Publication Date: 2018-05-04
XIAN TECHNOLOGICAL UNIV
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Problems solved by technology

The dual-band optical system can perform multi-band detection on the measured object, and simultaneously detect the measured objects in different radiation bands, which is impossible for a single optical system
The dual-band optical system has the comprehensive advantages of visible light, infrared or ultraviolet optical system, but it is not a simple addition, such as a dual-band optical system combining visible light and mid-wave infrared light. Among them, the visible light band opt

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  • Infrared-visible light dual-band photoelectric detection system and axis angle error measuring method
  • Infrared-visible light dual-band photoelectric detection system and axis angle error measuring method
  • Infrared-visible light dual-band photoelectric detection system and axis angle error measuring method

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Embodiment Construction

[0050] Such as figure 1 with figure 2 An infrared-visible dual-band photoelectric detection system is shown, including a reflection system arranged on the reflected light path of the measured object 1, a beam splitter 4 for splitting mid-wave infrared waves and visible light waves, and a beam splitter 4 for transmission The visible light imaging unit on the optical path, the mid-wave infrared light imaging unit on the reflection light path of the beam splitter 4, and the optical axis deflection angle measurement unit on the reflection light path of the reflection system, the object 1 can be reflected at the same time Wave infrared light and visible light.

[0051] In specific implementation, the reflection system reflects the visible light and mid-wave infrared light reflected by the test object 1 in parallel beams to the beam splitter 4, and the beam splitter 4 transmits the visible light to the visible light imaging unit and reflects the mid-wave infrared light to the middle. ...

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Abstract

The invention discloses an infrared-visible light dual-band photoelectric detection system and an axis angle error measuring method. The Infrared-visible light dual-band photoelectric detection systemand axis angle error measuring method comprises a reflecting system, a beam splitter, a visible light imaging unit on a reflecting path of the beam splitter, a medium-wave infrared imaging unit on atransmitting path, and an axis angle error measuring unit. The axis angle error measuring method comprises: I, initializing a CCD (charge coupled device) sensor, and acquiring a background gray image;II, centering a medium-wave infrared axis; III, performing visible light spot imaging; IV, acquiring a visible light spot image; V, acquiring coordinates of a center of mass of the visible light spotimage; VI, calculating axis angle error. The infrared-visible light dual-band photoelectric detection system and the axis angle error measuring method have the advantages that the advantages of a visible light band optical system and those of a medium-wave infrared band optical system are combined, observing efficiency and inspecting efficiency are improved, remote high-definition all-weather imaging is achieved, imaging quality is effectively improved, the axis angle error measuring unit can measure angle errors for visible light axis and medium-wave infrared axis, and stability of the photoelectric detection system can be measured.

Description

Technical field [0001] The invention belongs to the field of optical technology, and specifically relates to an infrared-visible dual-band photoelectric detection system and a method for measuring the deflection angle of an optical axis. Background technique [0002] With the improvement of social needs and the advancement of science and technology, higher and higher requirements are put forward for the performance of optical systems. Especially in the field of investigation and detection, fast and timely target discovery, and real-time tracking and accurate measurement target become optical Main trend of system development. [0003] In order to obtain more detection information and comprehensively detect and accurately observe the measured objects with different spectral characteristics, a dual-band and multi-band optical system has been developed. The dual-band optical system can perform multi-band detection of the measured object, as well as simultaneous detection of the measur...

Claims

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Application Information

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IPC IPC(8): G01S17/89G01S7/481G01M11/02G02B17/06G02B27/10H04N5/225H04N5/33H04N5/372H04N17/00
CPCH04N5/33H04N17/002G02B17/06G02B27/1006G01M11/00G01M11/0221G01S7/481G01S17/89H04N23/50H04N23/55H04N25/71
Inventor 于洵韩峰聂亮陶禹陈靖刘宝元路绍军张维光张祥伟马群尚小燕郭钰琳
Owner XIAN TECHNOLOGICAL UNIV
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