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Method and system for sampling and yield prediction of grain crops

A grain crop and yield measurement technology, applied in the field of grain crop sampling yield measurement methods and systems, can solve the problems of inability to obtain multi-level and hierarchical data, high manpower and financial costs, and insufficient representation, so as to reduce the waste of food resources, Effects of improving prediction accuracy and improving investigation efficiency

Active Publication Date: 2018-06-26
BEIJING NORMAL UNIVERSITY
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Problems solved by technology

However, with the rapid development of my country's agricultural modernization, although the current real-cut measurement method is constantly improving to meet the new measurement requirements, it also shows some shortcomings: (1) The sample update is lagging behind, with the land use and rapid changes in planting scale, the representativeness of the original fixed-point survey sites is insufficient; (2) multi-level and hierarchical data on grain crops in provinces, counties, and townships cannot be obtained; (3) the overall sown area is greatly affected, and the more accurate the sown area, (4) It is difficult to reflect the impact of natural disasters such as drought and flood on the yield; (5) The labor input in agricultural production measurement is relatively high, and the production measurement scheme that reduces manual input or mechanized automation Production testing tools to be developed
[0003] Due to the widespread use of actual cutting and actual measurement to conduct field surveys of sample plot yields, there are still high manpower and financial costs, low investigation efficiency, and the collection of a large number of actual cutting and actual measurement samples is also a waste of food resources.

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  • Method and system for sampling and yield prediction of grain crops
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  • Method and system for sampling and yield prediction of grain crops

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Embodiment Construction

[0053] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0054]In recent decades, with the continuous progress of meteorological and remote sensing observation / detection technology, the grain crop yield estimation technology based on meteorological and remote sensing data has basically matured and has been applied in business at home and abroad, making outstanding contributions to the accurate estimation of grain yield. , but it is still a "post-validation mode", and the verification of actu...

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Abstract

The present invention discloses a method and a system for sampling and yield prediction of grain crops. The method comprises: obtaining data of the cultivated land in the year when the predicted graincrop is produced; obtaining a first remote sensing image of the predicted grain crop in the growing season; performing image preprocessing on the first remote sensing image to obtain a remote sensinginversion parameter; according to the data of the cultivated land, the first remote sensing image and the remote sensing inversion parameter, determining the planting spatial distribution of the predicted grain crop; selecting the predicted sample plot from the planting spatial distribution; determining the per unit yield of the predicted sample plot; according to the per unit yield of the predicted sample plot and the remote sensing inversion parameter, constructing a yield prediction regression model; and according to the regression model and the remote sensing inversion parameter, obtaining the spatial distribution of the per unit yield of the predicted grain crop. According to the technical scheme of the present invention, the remote sensing inversion parameter is taken as an auxiliary parameter, the timeliness of the grain yield survey is improved, the survey cost is reduced, the survey efficiency is improved, the prediction accuracy is improved, and the waste of food resources caused by the survey is reduced.

Description

technical field [0001] The invention relates to the field of grain sampling yield measurement, in particular to a grain crop yield yield measurement method and system. Background technique [0002] As a basic indicator to measure the agricultural production of a country or region, grain output is directly related to food security issues, and even related to national security and social stability. Since the establishment of the National Bureau of Statistics in 1952, the survey, statistics and publication of grain output have been regularly conducted by the Rural Social and Economic Survey Department of the National Bureau of Statistics. Through continuous reform and innovation, the survey method of grain yield has experienced successive layers of reporting and summarization, sampling reporting and calculation, sampling and actual cutting. test method. At present, my country's grain production survey is mainly based on the sampling and actual measurement method of the "Natio...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/04G06Q50/02
CPCG06Q10/04G06Q50/02
Inventor 夏兴生郑学昌潘耀忠朱秀芳肖国峰张杜娟孙章丽
Owner BEIJING NORMAL UNIVERSITY
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