High-voltage light emitting diode street light, fault diagnosis method and readable storage medium

A high-voltage light-emitting and diode technology, applied in the direction of lamp testing, etc., can solve the problems of inconvenient lamp testing lamps, inability to directly identify lamp failures with the naked eye, and high installation positions of lamps

Active Publication Date: 2018-08-14
ANHUI UNIVERSITY OF ARCHITECTURE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Due to the high brightness of high-power high-voltage LED lamps used in outdoor roads and industrial and mining workshops, maintenance personnel cannot directly identify whether the lamps are f

Method used

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  • High-voltage light emitting diode street light, fault diagnosis method and readable storage medium
  • High-voltage light emitting diode street light, fault diagnosis method and readable storage medium
  • High-voltage light emitting diode street light, fault diagnosis method and readable storage medium

Examples

Experimental program
Comparison scheme
Effect test

example

[0076] In this diagnosis example, the similarity setting value is 0.9, and the value unit in the sample is ampere (A).

[0077] 1. Standard samples stored in the device:

[0078] (1) No. 1 standard sample (no fault sample):

[0079]

[0080]

[0081] (2) No. 4 standard sample (No. 3 light string failure sample):

[0082]

[0083] 2. The collected samples (here are two examples, one is not a problem, the other is a problem with the No. 3 light string)

[0084] (1) Samples without problems

[0085]

[0086]

[0087] After with Comparison, D=0.0185, S=0.9818, S>0.9, so it is considered that the collected data is consistent with the data of No. 1 sample, and the lamp has no fault.

[0088] (2) The problematic sample of light string No. 3

[0089]

[0090] After with Comparison, D=0.3164, S=0.7596, S0.9, the fault type of the corresponding sample data is the fault type corresponding to the collected data.

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PUM

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Abstract

The invention discloses a high-voltage light emitting diode street lamp, a fault diagnosis method and a readable storage medium. The fault diagnosis method comprises five steps of in an initializationstep, storing data samples of working current corresponding to all types of faults and a normal working state of the high-voltage light emitting diode street lamp in one working cycle, namely, faultdata samples; in a sampling step, collecting a test data sample of the working current of the high-voltage light emitting diode lamp in one complete working cycle according to a setting strategy; in aprocessing step, filtering the data of the collected test data sample; in a calculating step, calculating a similarity between the filtered test data sample and the stored fault data samples; in a diagnosis step, using the fault type corresponding to the fault data sample of which the similarity is greater than a set value as the fault of the lamp. The method achieves self-diagnosis of the faultof the high-voltage light emitting diode lamp.

Description

technical field [0001] The invention relates to a fault self-diagnosis method for a high-voltage light-emitting diode lamp and a high-voltage light-emitting diode street lamp with a fault diagnosis function. Background technique [0002] High-voltage LED (HV-LED) is a light-emitting diode that connects multiple LED chips in series / parallel, integrates, and packages, or realizes multiple LED PN junction connections at the material level, including high-voltage DC light-emitting diodes. There are two types of diodes and high-voltage AC light-emitting diodes. [0003] At present, the driving methods of high-voltage light-emitting diodes include segmental linear constant current and other types. Compared with traditional DC LED lamps, high-voltage LED lamps can reduce power consumption by 30% to 50%, and reduce manufacturing costs by 30% to 40%. The power drive is relatively simple, and it can transmit and utilize electric energy more effectively and resist electronic interfere...

Claims

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Application Information

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IPC IPC(8): G01R31/44
CPCG01R31/44
Inventor 孙富康方潜生孟浩
Owner ANHUI UNIVERSITY OF ARCHITECTURE
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