Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Lightning waveform parameter time domain statistical method based on optical integrated electric field sensor

A technology integrating electric field and statistical methods, applied in electrostatic field measurement and other directions, can solve problems such as economic loss, power system collapse, electrical equipment damage, etc., and achieve the effect of simple steps, easy measurement, and convenient installation.

Active Publication Date: 2018-08-17
ELECTRIC POWER RESEARCH INSTITUTE, CHINA SOUTHERN POWER GRID CO LTD +1
View PDF7 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When lightning strikes the overhead transmission line, it may cause the line switch to trip and cause a power outage, and it will also cause damage to electrical equipment, and even lead to vicious accidents such as the collapse of the power system, causing major economic losses and seriously affecting the stability, reliability and safety of the power system operation. sex and economy
[0003] In recent years, the lightning flashover of my country's power grid has been on the rise. The reasons are: 1. Lightning activities have intensified; Understand the law, lightning protection measures will get twice the result with half the effort

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Lightning waveform parameter time domain statistical method based on optical integrated electric field sensor
  • Lightning waveform parameter time domain statistical method based on optical integrated electric field sensor
  • Lightning waveform parameter time domain statistical method based on optical integrated electric field sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The lightning wave parameter time-domain statistical method based on the optical integrated electric field sensor proposed by the present invention comprises the following steps:

[0020] (1) Three optical integrated electric field sensors (in an embodiment of the present invention, the three-phase optical integrated electric field sensor used is produced by Tsinghua University, can refer to the Chinese patent application that publication number is CN102854403B) is installed in substation respectively to be measured Directly below the line, make the three optical integrated electric field sensors have the same height from the ground, and make the polarity orientation of the three optical integrated electric field sensors consistent, respectively pass light to the three optical integrated electric field sensors to monitor the line to be measured online Waveform of lightning overvoltage;

[0021] (2) When the line to be measured has a direct lightning strike or an induced...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a lightning waveform parameter time domain statistical method based on an optical integrated electric field sensor, and belongs to the technical field of waveform analysis. According to the method, the three-phase independent lightning overvoltage waveform is separated from the original waveform through the method of filtering, overvoltage extraction and decoupling based on the measurement data of the optical integrated electric field sensor, and statistical analysis of the measured waveform parameters is performed in the time domain according to the definition of thewavefront time, the half peak time and the overvoltage multiple of the lightning impulse voltage standard waveform in the IEC. The method is based on the optical integrated electric field sensor and has the characteristics of being convenient to install and convenient to measure.

Description

technical field [0001] The invention relates to a time-domain statistical method of lightning waveform parameters based on an optical integrated electric field sensor, and belongs to the technical field of waveform analysis. Background technique [0002] High-voltage overhead transmission lines are an important part of the power system. They are widely distributed, crisscross, and stretch for hundreds of miles or even thousands of kilometers, so they are extremely vulnerable to lightning strikes. Statistics show that the number of trips caused by lightning strikes on high-voltage overhead transmission lines in my country accounts for 40%-70% of the total number of trips in operation. In 2012, there were 1,894 lightning strike trips on 110kV and above transmission lines of China Southern Power Grid, accounting for 65.4% of the total number of trips. In areas with thunderstorms, mountainous areas, and areas with high soil resistivity, the accident rate of power transmission c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/14
CPCG01R29/14
Inventor 曾嵘蔡汉生刘刚庄池杰王涉施健刘磊
Owner ELECTRIC POWER RESEARCH INSTITUTE, CHINA SOUTHERN POWER GRID CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products