Attendance data testing method, terminal and equipment, and computer readable storage medium

Abstract

The embodiment of the invention discloses an attendance data testing method, terminal and equipment, and a computer readable storage medium. The method comprises the following steps that: dividing a testing equivalent time zone; randomly generating target attendance data to be tested; classifying the target attendance data to be tested one by one according to the equivalent time zone; according tothe classified target attendance data to be tested, generating an attendance test case; calling and executing the attendance test case; and storing the execution result of the attendance test case into a preset attendance information table. By use of the method, various attendance situations can be comprehensively covered by the test case, the test case is used for carrying out a test to shortentesting time and improve testing efficiency, and in addition, a testing result is closer to a true situation when an employee clocks in or out.

Description

technical field [0001] The present invention relates to the field of computer technology, in particular to a method for testing attendance data, a terminal, equipment and a computer-readable storage medium. Background technique [0002] For the clock-in machine, it is necessary to record the employee's clock-in time every time, and most companies have more clock-in times (for example, there are four clock-in times in a day, namely morning work, morning get off work, afternoon work, and afternoon get off work). , if manual clock-in time testing is used, it is easy to cause data confusion due to the large number of clock-in time tests, and manual testing is difficult to completely cover various abnormal clock-in situations. Failure to test abnormal clock-in situations will directly affect employees' monthly performance evaluation and Salary calculation results. Contents of the invention [0003] Embodiments of the present invention provide a method for testing attendance data...

AI Technical Summary

Problems solved by technology

[0002] For the clock-in machine, it is necessary to record the employee's clock-in time every time, and most companies have more clock-in times (for example, there are four clock-in times in a day, namely morning work, morning get off work, afternoon work, and afternoon get off work). , if manual clock-in time testing is used, it is easy to cause data confusion due to the large number of clock-in time tests, and manual testing is difficult to completely cover various abnormal clock-in situations. Failure to test abnormal clock-in situations will directly affect employees' monthly performance evaluation and Salary Calculation Results

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