System test method and apparatus, computer device and storage medium
A system test and test value technology, applied in the computer field, can solve the problems of low system test efficiency, large manpower and time consumption, etc., and achieve the effect of improving coverage and efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0054] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.
[0055] The system test method provided by this application can be applied to such as figure 1 shown in the application environment. Wherein, the test terminal communicates with the system server through the network. The test terminal receives the functional test instruction for the system to be tested, obtains the start interface identifier and the end interface identifier from the functional test instruction, and the test terminal obtains the test path diagram corresponding to the system to be tested, and searches the test path diagram containing the start interface iden...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com