Programmed type electronic load device capable of generating voltage output and testing method

Abstract

The invention provides a programmed type electronic load device capable of generating voltage output and a testing method. The device comprises a load power unit, a control unit and a voltage output unit, the control unit control the voltage output unit according to independent voltage setting to output voltage to a load port so as to trigger a connected power source to be tested to turn on the output load power unit for performing load pulling; or the control unit controls the voltage output unit according to voltage of a sampled object to be tested to output the matched voltage at the outputend of the object to be tested to the load port, and connection between an electronic load and the object to be tested is opened so as to avoid current generated by the voltage difference of two equipment ports; the phenomenon that instant large current caused by a port capacitor and then self-protection and component loss of the power source to be tested are caused is eliminated; meanwhile, setvoltage is output through set parameters, the battery voltage is simulated, and the power source to be tested outputs energy to an electronic load device for performing normal load pulling.

Description

technical field [0001] The present invention relates to an electronic load device, in particular to a program-controlled electronic load device capable of generating voltage output, and also to a testing method for the program-controlled electronic load device to be tested. Background technique [0002] The electronic load device can simulate the DUT under test in the real environment. On the one hand, due to the certain capacitance of the electronic load port, when the DUT under test, such as the power supply under test, is connected to the load, the voltage of the power supply under test will charge the capacitance of the load port. , the current at the moment of contact is equal to the ESR of the power supply voltage under test / load port capacitance. This is a very large current that will cause arcing, easily damage the switching device or terminal, and often cause the overcurrent protection of the power supply under test to fail. does not work properly, such as figure 1...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a program-controlled electronic load device capable of generating voltage output, which solves the problem of sparking due to the presence of port capacitance when the power supply to be tested and the electronic load device are connected, and the problem of DUT detection due to the DUT. The problem that the electronic load cannot work normally due to the lack of port voltage and no output

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