The invention discloses a
critical load determination method and device of a film, equipment and a storage medium. According to the method, a total input work load curve is determined through a film scratch experiment, a baseline
energy load curve of a whole stage is determined based on an instantaneous
normal load and total input work of an initial stage of the scratch experiment, and then a failure
energy load curve is determined according to an
energy balance method; according to the method, the failure
energy load curve is subjected to first-order derivation, the
peak value of the first-order derivative curve is searched to determine the
critical load of the thin film, the subjectivity of manual observation and the fuzziness of a friction curve are eliminated, and the
repeatability of the result is greatly improved; moreover, according to the method,
cracking energy and stripping energy do not need to be calculated respectively, the physical problem of directly calculating the
cracking energy and the stripping energy is avoided, the
peak value of the first-order derivative of the failure energy load curve corresponds to stripping in adhesion failure more accurately physically, and therefore the
critical load can be accurately determined based on the stripping point.