A method for dynamic monitoring of storage device data security

Abstract

The invention discloses a dynamic monitoring method for data security of a storage device, which is characterized in that the storage device adds a data scanning process, and the storage device periodically detects whether the data scanning start condition is met, and starts to scan the entire disk of the storage device when the data scan start condition is met Operation, the full disk scan checks the block mark BEC value stored in each block in units of blocks, if the block mark BEC value is greater than the safety threshold, then move the data stored in the block to a new data block, so The block flag BEC value is the maximum BEC value generated by each page detected during the block read operation. It is proposed to realize dynamic monitoring of storage device data security by monitoring the most error-prone data page intervals in each block. Compared with full-disk and full-data scanning, it greatly saves system resources and effectively solves the problem that the reading operations caused by monitoring will occupy NAND Flash bandwidth and system memory resource issues.

Description

technical field [0001] The invention relates to the technical field of storage, in particular to a method for dynamically monitoring data security of a storage device. Background technique [0002] The smallest unit of NAND Flash storage data is Cell. The Cell of SLC can represent two states of 0 and 1, the four states of MLC are 00, 01, 10 and 11, and the eight states of TLC are 000, 001, 010, 011, 100, 101, 110 and 111. They are all realized by charging and discharging electrons. When standing still, or affected by other Pages, or affected by the life of the Block, the Cell is not always stable, and the electrons it stores may be slowly lost, resulting in Bit errors, which in turn lead to data loss. [0003] If the data on the NAND Flash has not been accessed for a long time, the problem is even more prominent, because the degree of electronic loss cannot be assessed. If the number of Bit errors exceeds the ECC error correction capability, the data cannot be repaired. ...

AI Technical Summary

Problems solved by technology

[0005] Therefore, some technologies propose to increase the overall monitoring strategy, figure 1 It is a schematic diagram of the existing monitoring scheme. When the host needs to access this data, it triggers to read the physical address, and judges the data on this physical address. When all pages of all data blocks are scanned and monitored without distinction , When an error occurs, the error correction module is used for error correction processing, so the system consumption increases and there is a large waste

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