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Methods for aligning a spectrometer

A spectrometer, instrument technology, applied in the field of aligning spectrometers, to solve problems such as increased cost and complexity

Active Publication Date: 2018-09-28
UNIV OF WASHINGTON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Two-axis tilt correction is usually done with two sets of motorized micrometers, adding cost and complexity
Additionally, biaxial tilt correction may be required each time a particular CCA is used

Method used

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  • Methods for aligning a spectrometer
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  • Methods for aligning a spectrometer

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Embodiment Construction

[0025] As noted above, one method for addressing spectrometer alignment errors caused by crystal analyzers formed from mis-cut wafers is to use dual-axis tilt correction. Other methods for reducing alignment errors are disclosed herein. These methods involve rotating the crystal analyzer about an axis within the instrument plane (eg, Rowland circle) of the spectrometer. By finding the maximum intensity of the diagnostic signal corresponding to each rotational position of the crystal analyzer, it is possible to determine the first rotational position in which the reciprocal lattice vector of the crystal analyzer lies within the plane of the instrument. Alternatively, by finding the minimum intensity of the diagnostic signal corresponding to each rotational position of the crystal analyzer, a second rotational position can be determined where the projection of the reciprocal lattice vector on the rotational plane is perpendicular to the instrument flat.

[0026] From the first...

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Abstract

An example method for aligning a spectrometer is described herein. The spectrometer includes a radiation source, a crystal analyzer, and a detector that are all positioned on an instrument plane. Themethod includes rotating the crystal analyzer about an axis that is within the instrument plane and perpendicular to a rotation plane such that (i) a reciprocal lattice vector of the crystal analyzeris within the instrument plane or (ii) a component of the reciprocal lattice vector within the rotation plane is perpendicular to the instrument plane. An origin of the reciprocal lattice vector is located on the axis. The method further includes tilting the crystal analyzer or translating the detector such that the reciprocal lattice vector bisects a line segment that is bounded by the detector and the radiation source. Example spectrometers related to the example method are also disclosed.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of US Provisional Patent Application No. 62 / 271,992, filed December 28, 2015, the contents of which are hereby incorporated by reference in their entirety. [0003] Statement Regarding Federally Funded Research or Development [0004] This invention was made with government support under Contract Nos. DE-FG02-09ER16106 and DE-SC0008580 awarded by the US Department of Energy. The government has certain rights in this invention. technical field Background technique [0005] Unless otherwise indicated herein, the materials described in this section are not prior art to the claims in this application and are not admitted to be prior art by inclusion in this section. [0006] Many X-ray spectrometers use a curved crystal analyzer (CCA) to monochromatize X-rays to illuminate a sample or to monochromatize X-rays emitted from or transmitted through a sample. CCAs are typically fabricated ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/02G01N23/20G01N23/207G01N21/63G02F1/355
CPCG21K1/06G01N23/2076G21K2201/062G21K2201/067G01N23/20083G01N23/20016G21K2201/06G21K2201/064G01N23/20G01N23/20091G01N23/207G01N23/22G01N23/20008
Inventor D·R·莫滕森G·T·塞德勒
Owner UNIV OF WASHINGTON
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