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Depth imaging system and temperature error correction method thereof

A technology of temperature error and imaging system, which is applied in the fields of optics and electronics, can solve the problems of lowering the accuracy of the depth imaging system, achieve the effect of simplifying the structure, improving the measurement accuracy, and realizing error correction

Pending Publication Date: 2018-10-26
SHENZHEN ORBBEC CO LTD
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Problems solved by technology

[0003] The present invention provides a depth imaging system and its temperature error correction method in order to solve the problem in the prior art that the temperature reduces the accuracy of the depth imaging system

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  • Depth imaging system and temperature error correction method thereof
  • Depth imaging system and temperature error correction method thereof
  • Depth imaging system and temperature error correction method thereof

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Embodiment Construction

[0021] The present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be emphasized that the following descriptions are only exemplary and not intended to limit the scope of the present invention and its application.

[0022] In order to make the technical problems, technical solutions and beneficial effects to be solved by the embodiments of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0023] In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features....

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Abstract

The application provides a depth imaging system and a temperature error correction method. The method includes the following steps: obtaining a first reference structured light image and a target structured light image; performing matching calculation on the first reference structured light image and the target structured light image to obtain a corresponding pixel pair; performing temperature error correction based on the pixel pair and a temperature error compensation model, and acquiring a second reference structured light image; and performing depth calculation by using the second reference structured light image and the target structured light image to acquire a depth image. According to the above depth imaging system and the temperature error correction method, the error correction of reference structured light can be realized, the error correction of depth measurement can be further realized, and finally, the measurement accuracy of the depth imaging system can be improved; andmeanwhile, the process of measuring the current temperature by using an additional temperature sensor is not required, and the structure of the depth imaging system can be simplified.

Description

technical field [0001] The invention relates to the technical fields of optics and electronics, in particular to a depth imaging system and a temperature error correction method thereof. Background technique [0002] The structured light depth imaging system has been widely used in 3D modeling, somatosensory interaction, face recognition, AR and other fields due to its full-field measurement, high resolution, and real-time performance. One of the core components of the structured light depth imaging system is the structured light projection module, which is composed of lasers, optical elements and other devices, and is used to project a preset structured light image, which will inevitably be affected by temperature during the projection process , leading to a deviation between the projected structured light image and the preset structured light image, this deviation will directly affect the calculation of the subsequent depth image, and eventually lead to an error in the dep...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/33
CPCG06T7/344
Inventor 许星黄源浩
Owner SHENZHEN ORBBEC CO LTD
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