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Test method, test device, test carrier plate, and test system

A test method and technology for testing carrier boards, applied in the field of testing, can solve the problems of limited number of test ports and increased production costs, etc.

Pending Publication Date: 2018-11-02
CHANGXIN MEMORY TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Due to the limited number of test ports of the existing test equipment (Tester), in order to speed up the test speed of the chip and increase the production capacity of the chip, it is necessary to increase the number of test equipment, but this will increase the production cost accordingly

Method used

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  • Test method, test device, test carrier plate, and test system
  • Test method, test device, test carrier plate, and test system
  • Test method, test device, test carrier plate, and test system

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Embodiment Construction

[0036] Typical embodiments embodying the features and advantages of the present invention will be described in detail in the following description. It should be understood that the present invention can have various changes in different embodiments without departing from the scope of the present invention, and that the description and drawings therein are illustrative in nature and not intended to limit the present invention. invention.

[0037] In the following description of various exemplary embodiments of the invention, reference is made to the accompanying drawings, which form a part hereof, and in which are shown by way of example different exemplary structures, systems, and embodiments in which aspects of the invention may be implemented and steps. It is to be understood that other specific arrangements of components, structures, exemplary means, systems and steps may be utilized and structural and functional modifications may be made without departing from the scope o...

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PUM

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Abstract

The embodiment of the invention provides a test method, a test device, a test carrier plate, and a test system. The test method includes steps of outputting a first test signal from the first input / output port of the test device to the first channel of the test carrier plate, wherein the first test signal is configured to generate a second test signal and a third test signal; receiving a third feedback signal returned from the first channel by the first input / output port, wherein the third feedback signal is generated according to a first feedback signal and a first feedback signal; determining whether a first chip to be tested and a second chip to be tested are in normal working states according to the third feedback signal. The test method, the test device, the test carrier plate, and the test system can increase the number of chips to be tested simultaneously measured by the test device.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a testing method, testing equipment, a testing carrier board and a testing system. Background technique [0002] In the prior art, various chips such as DRAM (Dynamic Random Access Memory, Dynamic Random Access Memory) have extremely high requirements on performance. In order to ensure that there are no errors in the application process, it is necessary to test the performance of the chips shipped out of the factory. [0003] Due to the limited number of test ports of existing test equipment (Tester), in order to speed up the test speed of the chip and increase the production capacity of the chip, it is necessary to increase the number of test equipment, but this will increase the production cost accordingly. [0004] It should be noted that the information disclosed in the above background technology section is only used to enhance the understanding of the background...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R1/04
CPCG01R1/04G01R31/28
Inventor 不公告发明人
Owner CHANGXIN MEMORY TECH INC