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a test device

A test device and test probe technology, applied in the directions of measuring device, measuring device casing, measuring electricity, etc., can solve the problems of inability to meet the use requirements, occupying a large space, complex structure, etc., and achieving light weight, small occupied space, Easy-to-use effects

Active Publication Date: 2021-01-05
SUZHOU SECOTE PRECISION ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing test devices used in the electronics industry have complex structures and take up a lot of space, which cannot meet the requirements of use

Method used

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Embodiment Construction

[0025] The present invention will be further described in detail below in conjunction with the accompanying drawings, so that those skilled in the art can implement it with reference to the description.

[0026] Such as figure 1 , figure 2 and Figure 7 As shown, the present invention provides a testing device, comprising: a loading board 10; a position limiting unit 20, which is arranged on the loading board 10; a testing unit 40, which is arranged on a side of the loading board 10. side; and a PCB adapter plate unit 30; wherein, the product to be tested that is electrically connected with the PCB adapter plate unit 30 is arranged on the position-limiting unit 20, and the test unit 40 includes a base bracket 41, A swivel seat 42 provided with a test probe 47 and pivotally connected to the base bracket 41, during testing, press down the swivel seat 42 so that the test probe 47 is in contact with the PCB adapter board unit 30 to form an electrical connection.

[0027] As a...

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PUM

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Abstract

The present invention discloses a test device. The device comprises; a bearing plate; a spacing unit arranged on the bearing plate; a test unit arranged at one side of the bearing plate; and a PCB adapter plate unit, wherein, the spacing unit is provided with a product to be tested electrically connected with the PCB adapter plate unit, the test unit comprises a pedestal support and a rotation seat provided with a test probe and pivoted on the pedestal support. When test is performed, the rotation seat is pressed down to allow the test probe to be in contact with the PCB adapter plate unit toform electrical connection. The test device can be suitable in occasions with limited operation spaces, is compact in structure, small in occupation space and light in weight.

Description

technical field [0001] The invention relates to the technical field of testing devices, in particular to a testing device with a self-locking function. Background technique [0002] Nowadays, in order to ensure the reliability of product quality in the electronics industry, each product will go through many testing procedures during the production process. Small for easy handling. Existing test devices used in the electronics industry have complex structures and take up a lot of space, which cannot meet the use requirements. Therefore it is necessary to study a test device. Contents of the invention [0003] Aiming at the deficiencies in the above technologies, the present invention provides a testing device with a compact structure and a small occupied space. [0004] The technical solution adopted by the present invention to solve the technical problem is: a testing device, comprising: a bearing plate; a position limiting unit, which is arranged on the bearing plate; ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G01R31/00
CPCG01R1/0416G01R31/00
Inventor 孙丰
Owner SUZHOU SECOTE PRECISION ELECTRONICS CO LTD