Measurement system, method, device and readable storage medium

Abstract

The present invention relates to a measurement system, a measurement method, a measurement device and a readable storage medium. The measurement system is used for measuring the height dimension of astructure to be measured. The structure to be measured comprises a horizontal bottom plate and a vertical side plate connected with the horizontal bottom plate; and the inner side wall of the verticalside plate is provided with a point to be measured, wherein the point to be measured does not exceed the inner side wall of the vertical side plate in a horizontal direction. The measurement system comprises a measuring instrument and a reflector; the reflector comprises a reflecting surface which can be arranged in a manner that the reflecting surface faces the vertical side plate; the reflecting surface is used for vertically reflecting incident light horizontally emitted from the point to be measured to the probe of the measuring instrument; and the measuring instrument performs focusing so as to capture the corresponding incident point of the point to be measured on the reflecting surface, and acquires the height of the incident point relative to a reference surface so as to calculatethe height of the point to be measured relative to the top surface of the vertical side plate according to the height of the top surface of the vertical side plate relative to the reference surface.With the measurement system, the measurement method, the measurement device and the readable storage medium of the invention adopted, the height of the point to be measured on the inner side wall of the vertical side plate relative to the top surface of the vertical side plate can be obtained without the structure to be measured being damaged, and therefore, the accuracy of the size of the structure to be measured can be ensured.

Description

technical field [0001] The present disclosure relates to the field of measurement technology, and in particular to a measurement system, method and device, and a readable storage medium. Background technique [0002] The structural size of the assembled parts in the electronic equipment is an important factor in determining whether the assembled electronic equipment conforms to the design specifications. Therefore, in a related technology, the size to be measured can be scaled up proportionally by a projection measuring instrument, and then in Dimensional measurements are made on projections. However, this measurement method will be limited by the shooting direction of the lens on the projection measuring instrument; for example, when it is necessary to measure the size on the inner wall of the assembly part, because the lens cannot directly shoot the point to be measured, the assembly part needs to be cut to expose The point to be measured is convenient for camera shooting...

AI Technical Summary

Problems solved by technology

However, this measurement method will be limited by the shooting direction of the lens on the projection measuring instrument; for example, when it is necessary to measure the size on the inner wall of the assembly part, because the lens cannot directly shoot the point to be measured, the assembly part needs to be cut to expose The point to be measured is convenient for camera shooting, which will cause product damage, increase the measurement process, and cause unnecessary losses

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