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An intelligent test system and method

A testing method and intelligent technology, applied in faulty hardware testing methods, detecting faulty computer hardware, etc., can solve problems such as costing a lot of manpower and material resources, mismatching development trends of electronic products, lack of automated testing capabilities, etc., to achieve manpower The effect of reducing consumption and improving test efficiency

Active Publication Date: 2021-09-10
BEIJING INST OF ELECTRONICS SYST ENG
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] The test system is an inspection tool for the quality of electronic products, and can provide regular maintenance for products to ensure stable and reliable work. However, with the explosive development of the electronics industry and the deepening of test coverage, the semi-automatic The test system will consume a lot of manpower and material resources. In order to overcome this bottleneck problem, a test system that can get rid of manual intervention, have independent decision-making ability, increase speed and improve quality has become an urgent need
[0003] The currently widely used test system is mainly composed of a main control computer, a measurement and control combination, a data processing computer, and test system software. It requires manual test operations and interpretation of test data. It does not have complete automated test capabilities, let alone independent decision-making capabilities. Does not match the development trend of electronic products

Method used

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  • An intelligent test system and method

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Embodiment Construction

[0041] In order to illustrate the present invention more clearly, the present invention will be further described below in conjunction with preferred embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention.

[0042] figure 1 It shows a schematic structural diagram of an intelligent test system provided by an embodiment of the present invention.

[0043] Such as figure 1 As shown, the system includes: an object under test 1, a test module 2, an edge computing module 3, a general control module, and a processing module 4; the test module 2 collects signals and provides energy to the object under test 1 according to the edge computing module 3 , signal excitation and communication control; the edge computing module 3 performs fe...

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Abstract

One aspect of the present invention provides an intelligent testing system and method, which is characterized by comprising: a tested object, a testing module, an edge computing module, a general control module, and a processing module. Compared with the existing design method, the system and method provided by the present invention realizes no manual intervention and autonomous decision-making of the test system. The test efficiency is greatly improved, and the labor consumption is significantly reduced.

Description

technical field [0001] The invention relates to an intelligent test system, in particular to an intelligent test system and method. Background technique [0002] The test system is an inspection tool for the quality of electronic products, and can provide regular maintenance for products to ensure stable and reliable work. However, with the explosive development of the electronics industry and the deepening of test coverage, the semi-automatic The test system will consume a lot of manpower and material resources. In order to overcome this bottleneck problem, a test system that can get rid of manual intervention, have independent decision-making capabilities, and increase speed and improve quality has become an urgent need. [0003] The currently widely used test system is mainly composed of a main control computer, a measurement and control combination, a data processing computer, and test system software. It requires manual test operations and interpretation of test data. I...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
CPCG06F11/2273
Inventor 信朝阳赵红慧乔道鹏苏冬泽张春玲
Owner BEIJING INST OF ELECTRONICS SYST ENG