Three-path V/F conversion circuit testing system based on LabVIEW

A technology for converting circuits and test systems, applied in the field of circuits, can solve problems such as the influence of test accuracy and the incompleteness of measured parameters, and achieve the effects of improving test efficiency, shortening test time, and reducing influence

Inactive Publication Date: 2018-11-16
NORTH ELECTRON RES INST ANHUI CO LTD
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AI Technical Summary

Problems solved by technology

[0002] Traditional voltage-frequency conversion circuit test systems mostly collect single-channel and dual-channel signals, and the measured parameters are not comprehensive enough, which affects the test accuracy

Method used

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  • Three-path V/F conversion circuit testing system based on LabVIEW
  • Three-path V/F conversion circuit testing system based on LabVIEW
  • Three-path V/F conversion circuit testing system based on LabVIEW

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Embodiment Construction

[0029] The present invention will be further described below in conjunction with the drawings. The following embodiments are only used to illustrate the technical solutions of the present invention more clearly, and cannot be used to limit the protection scope of the present invention.

[0030] The block diagram of the hardware test system implemented by the present invention is as follows figure 1 As shown, the system is mainly composed of power conversion and current detection unit, precision voltage source, signal source, frequency acquisition card / counter, computer and circuit connection board unit. First, the power conversion and current detection unit provides +15V, -15V and +5V power supply voltages, and the computer reads the data of the ammeter head to detect the working current; the signal source provides the clock signal for the circuit under test (in the alternative circuit connection board unit The CLK clock signal provided by the peripheral circuit is a redundant de...

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Abstract

The invention discloses a three-path V / F conversion circuit testing system based on LabVIEW, and the system comprises a power conversion and current detection unit, a precise voltage source, a signalsource, a frequency acquisition card / counter and a circuit connection board unit. The power conversion and current detection unit provides +15V, -15V and +5V power voltages, and the data of a currentmeter is read by a computer to detect a working current. The computer controls the output of the precise voltage source and the power of the precise voltage source is supplied to a tested circuit through a circuit connection board unit. A measured three-path V / F conversion circuit converts a voltage signal outputted by the precise voltage source into a corresponding 6-channel pulse signal, and thecomputer collects the pulse signal through the frequency acquisition card / counter. The system controls the voltage signal through a LabVIEW program, collects and processes the corresponding pulse signals outputted by the three-path V / F conversion circuit, and realizes the function and parameter test of the V / F conversion circuit.

Description

Technical field [0001] The invention relates to a three-way V / F conversion circuit test system based on LabVIEW, belonging to the technical field of circuits. Background technique [0002] Traditional voltage-frequency conversion circuit test systems mostly collect single-channel dual-channel signals, and the measured parameters are not comprehensive enough, and the test accuracy is affected. Compared with the prior art, the present invention has the advantages of single power supply, one-key automatic testing, three-way 6-channel simultaneous testing, and more comprehensive measured functions and parameters. Summary of the invention [0003] The purpose of the present invention: The present invention designs a V / F conversion circuit test system, which controls the voltage signal Vin through the LabVIEW program, collects and processes the corresponding pulse signals output by the three-channel V / F conversion circuit, and realizes the V / F conversion Circuit function and parameter ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R23/10
CPCG01R23/10G01R31/2834
Inventor 金肖依李建和鲁争艳涂志刚李贵娇
Owner NORTH ELECTRON RES INST ANHUI CO LTD
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