Image processing based cable semi-conductive layer automatic detection method

A semi-conductive layer and image processing technology, applied in image data processing, image enhancement, image analysis, etc., can solve problems such as many calculation items, calculation errors, and complicated manual measurement

Active Publication Date: 2018-11-20
ZHEJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY
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Problems solved by technology

[0004] 1. Manual measurement is complicated, and the measurement error caused by human factors is relatively large. It is necessary to manually estimate the position of the center of the circle and select the measurement point of the test piece
[0005] 2. Manual calculation is complex, with many calculation items and a large amount of calculation, which is prone to calculation errors
[0006] 3. Corresponding measuring tools are required for measurement. When measuring some test pieces, a reading microscope or a projector with a magnification of at least 10 times is often required as a measuring device. The operation is complicated, takes a long time, and requires high requirements for testers.
[000

Method used

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  • Image processing based cable semi-conductive layer automatic detection method
  • Image processing based cable semi-conductive layer automatic detection method
  • Image processing based cable semi-conductive layer automatic detection method

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Embodiment Construction

[0069] In order to describe the present invention more specifically, the technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0070] Such as figure 1 As shown, an image processing-based automatic detection method for the semiconducting layer of an insulating sheet includes the following steps:

[0071] (1) Select a test piece of the cable to be tested with less knife marks and a relatively obvious boundary between the semiconductive layer and the insulating layer, use the cover glass to flatten the test piece to eliminate the interference of the test piece from warping and bending, and then adjust the light source to Appropriate location and light intensity;

[0072] (2) Use a high-resolution industrial camera to collect test piece images;

[0073] (3) Perform image preprocessing on the collected test piece image: gray scale, threshold value:

[0074] Image grayscale:

[007...

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Abstract

The invention discloses an image processing based insulating sheet semi-conductive layer automatic detection method, which can achieve automatic detection of an insulating sheet semi-conductive layerof a cable. The method includes: acquiring a cable insulation sheet test piece image; performing image preprocessing; extracting a region of interest; segmenting the region of interest, screening a segmented connected domain set, and generating a semi-conductive layer profile; and performing defect detection and compensation on the generated semi-conductive layer profile. The insulating sheet semi-conductive layer automatic detecting method has high detection efficiency and high precision, fully considers factors such as knife marks and illumination, and greatly reduces the working load of thetesting personnel.

Description

technical field [0001] The invention belongs to the technical field of precision measurement, in particular to an image processing-based automatic detection method for cable semiconducting layers. Background technique [0002] At present, the method of measuring parameters such as the thickness, area and eccentricity (or eccentricity) of the cable semiconducting layer is manual measurement. For example, to measure the thickness and eccentricity of the semiconducting layer at present, it is generally to use a measuring projector to enlarge the cable test piece to a certain magnification and project it on the screen through optical projection, and then read the coordinates of different positions by manually moving the coordinate bracket. Calculate the thickness value, and then calculate the eccentricity. [0003] However, the following problems will arise when using traditional devices and measurement methods to measure the thickness of the cable semiconducting layer: [000...

Claims

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Application Information

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IPC IPC(8): G06K9/32G06T7/00G06T7/11G06T7/136G06T7/194G01B11/06G01B11/28G01B11/275
CPCG06T7/0004G06T7/11G06T7/136G06T7/194G01B11/06G01B11/2755G01B11/28G06T2207/10004G06T2207/20081G06V10/25
Inventor 侯北平董霏吴颖东黄俊朱文介婧于爱华
Owner ZHEJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY
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