Batch test method of high-speed parallel multi-channel photoelectric transceiving modules

Abstract

The invention provides a batch test method of high-speed parallel multi-channel photoelectric transceiving modules. A PRBS code is sent by a four-channel bit error tester, one path of single-ended signals is input to a standard parallel transmitting module, and the other path of single-ended signals is input to a parallel module to be tested; the parallel module to be tested inputs an electrical modulation signal and outputs multiple paths of high-speed parallel optical signals to an optical switch, and the optical switch inputs the optical signals into an eye diagram instrument by scanning totest performance indexes and record data; and the standard parallel transmitting module outputs multiple paths of high-speed parallel modulated optical signals to a four-way stored program control attenuator after receiving electrical signals, and adjusts the size of each path of output optical power as a sensitivity determination index by the readback and feedback control of a monitored value; and each path of attenuated high-speed modulated optical signals is correspondingly input to an optical signal receiving input port of the parallel module to be tested, and outputs high-speed parallelelectrical signals to a received signal input port corresponding to the four-channel bit error tester so as to achieve a receiving end bit error test of the parallel module to be tested. The batch test method provided by the invention is small in device investment and high in test efficiency.

Description

Technical field [0001] The present invention relates to the field of optical communication technology, in particular to a batch test method of high-speed parallel multi-channel photoelectric transceiver modules. Background technique [0002] Big data and cloud computing have stimulated the large-scale planning and construction of data centers and related equipment. The number of channels and transmission rates of high-speed parallel multi-channel optoelectronic transceiver modules are getting higher and higher. If the production and debugging of modules are based on the single-channel optoelectronic transceiver module test architecture, debugging It takes several hours for a CXP optical module to transmit and receive 12 channels in parallel. If the number of channels is increased to 24 channels, the debugging time will increase several times. For orders of hundreds of thousands of pieces in batches, it is difficult for customers to guarantee delivery. In order to improve the tes...

AI Technical Summary

Problems solved by technology

[0005] For a general-scale optical module manufacturer, this test architecture requires too much equipment investment, which is difficult to achieve

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