Batch test method of high-speed parallel multi-channel photoelectric transceiving modules

A photoelectric transceiver and multi-channel technology, applied in the field of optical communication, can solve the problems of large equipment investment and difficulty in implementation, and achieve the effect of small equipment investment and high test efficiency

Active Publication Date: 2018-11-30
JIANGSU ALLRAY
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Problems solved by technology

[0005] For a general-scale optical module manufacturer, this test architec

Method used

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  • Batch test method of high-speed parallel multi-channel photoelectric transceiving modules
  • Batch test method of high-speed parallel multi-channel photoelectric transceiving modules
  • Batch test method of high-speed parallel multi-channel photoelectric transceiving modules

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Embodiment Construction

[0022] See image 3 , The batch test method of high-speed parallel multi-channel photoelectric transceiver module includes the following steps:

[0023] (1) For the PRBS code (pseudo-random code) sent by the four-channel BER tester, one single-ended signal is input to the standard parallel transmission module, and the other single-ended signal is input to the parallel module to be tested as a transmission electrical modulation signal;

[0024] (2) After the parallel module under test inputs the electrical modulation signal, it outputs high-speed parallel multiple optical signals to the optical switch through photoelectric conversion. The optical switch is controlled by the upper software to scan and input the optical signal to the eye chart. Go to the Nth channel to test the performance indicators in turn and record the data of each channel to complete the transmitter test of the module under test;

[0025] (3) After the standard parallel transmitter module receives the electrical si...

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Abstract

The invention provides a batch test method of high-speed parallel multi-channel photoelectric transceiving modules. A PRBS code is sent by a four-channel bit error tester, one path of single-ended signals is input to a standard parallel transmitting module, and the other path of single-ended signals is input to a parallel module to be tested; the parallel module to be tested inputs an electrical modulation signal and outputs multiple paths of high-speed parallel optical signals to an optical switch, and the optical switch inputs the optical signals into an eye diagram instrument by scanning totest performance indexes and record data; and the standard parallel transmitting module outputs multiple paths of high-speed parallel modulated optical signals to a four-way stored program control attenuator after receiving electrical signals, and adjusts the size of each path of output optical power as a sensitivity determination index by the readback and feedback control of a monitored value; and each path of attenuated high-speed modulated optical signals is correspondingly input to an optical signal receiving input port of the parallel module to be tested, and outputs high-speed parallelelectrical signals to a received signal input port corresponding to the four-channel bit error tester so as to achieve a receiving end bit error test of the parallel module to be tested. The batch test method provided by the invention is small in device investment and high in test efficiency.

Description

Technical field [0001] The present invention relates to the field of optical communication technology, in particular to a batch test method of high-speed parallel multi-channel photoelectric transceiver modules. Background technique [0002] Big data and cloud computing have stimulated the large-scale planning and construction of data centers and related equipment. The number of channels and transmission rates of high-speed parallel multi-channel optoelectronic transceiver modules are getting higher and higher. If the production and debugging of modules are based on the single-channel optoelectronic transceiver module test architecture, debugging It takes several hours for a CXP optical module to transmit and receive 12 channels in parallel. If the number of channels is increased to 24 channels, the debugging time will increase several times. For orders of hundreds of thousands of pieces in batches, it is difficult for customers to guarantee delivery. In order to improve the tes...

Claims

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Application Information

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IPC IPC(8): H04B10/073
CPCH04B10/0731
Inventor 于佩
Owner JIANGSU ALLRAY
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