Gas sampling analysis system and sampling analysis method using same

Abstract

The invention discloses a gas sampling analysis system and a sampling analysis method using the same. The gas sampling analysis system comprises a sample gas tank, a nitrogen tank, a piston sample storage device, a vacuum pump and a gas analyzer. Gas outlets of the sample gas tank and the nitrogen tank are both connected with a gas inlet of the piston sample storage device, and a gas outlet of thepiston sample storage device is connected with gas inlets of the vacuum pump and the gas analyzer respectively. The piston sample storage device comprises a gas storage cylinder and a piston which isarranged in the gas storage cylinder and is in sliding fit with the gas storage cylinder. A flange plate fixedly connected with the gas storage cylinder is arranged at one end of the gas storage cylinder. A push rod fixedly connected with the piston penetrates through the other end of the gas storage cylinder.. A support seat fixedly connected with the push rod is arranged on the push rod. The gas sampling analysis system can not only sample high-temperature gas sources, low-temperature gas sources, high-pressure gas sources and low-pressure gas sources, but also analyze collected gas components in real time, so that the accuracy of experimental data is improved.

Description

technical field [0001] The invention relates to the technical field of gas sampling and analysis, in particular to a gas sampling and analysis system and a method thereof. Background technique [0002] At present, gas sampling devices are widely used in petroleum, chemical, pharmaceutical and other industries. According to the different pressures applicable to gas sampling devices, they can be divided into high-pressure sampling and low-pressure sampling. Gas sampling devices with an operating pressure higher than 0.1MPa are high-pressure systems Sampling device, and vice versa for low-pressure system sampling device. According to whether the structure of the gas sampling device is airtight, it can be divided into airtight and non-hermetic sampling devices. Although the structure of the non-hermetic gas sampling device is simple, the airtightness is poor, resulting in sample loss and leakage during measurement. [0003] Most of the existing gas sampling systems or devices a...

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Problems solved by technology

[0004] The purpose of the present invention is to provide a gas sampling and analysis system and method thereof, which can sample high-temperature gas sources, low-temperature gas sources, high-pressure gas sources and low-pressure gas sources, and solve the current problem of sampling high-temperature and low-pressure gas sources. At the same time, real-time analysis and processing of gas source components can be performed to reduce errors in the measurement and analysis process and improve the accuracy of test results

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