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Multi-sampling CMOS image sensor pixel structure and ultra-high speed image acquisition method thereof

A technology of image sensor and pixel structure, which is applied in image communication, electrical components, television, etc., can solve the problems of poor imaging performance, complex process, high cost, etc., and achieve the goal of small process change, low implementation difficulty, and reduced development cost Effect

Inactive Publication Date: 2018-12-18
NORTHWEST INST OF NUCLEAR TECH
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Problems solved by technology

[0006] In order to solve the technical problems of high cost, poor imaging performance and complicated process when the ultra-high-speed imaging capability of tens of nanoseconds of the CMOS image sensor is realized by using the existing technology, the present invention provides a multi-sampling CMOS image sensor pixel structure And its ultra-high-speed image acquisition method

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  • Multi-sampling CMOS image sensor pixel structure and ultra-high speed image acquisition method thereof
  • Multi-sampling CMOS image sensor pixel structure and ultra-high speed image acquisition method thereof
  • Multi-sampling CMOS image sensor pixel structure and ultra-high speed image acquisition method thereof

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Embodiment Construction

[0036] Multi-sampling CMOS image sensor pixel structure provided by the present invention, and figure 1 The traditional CMOS image sensor pixel structure shown is different in that a photodiode in the present invention is connected to multiple control switch tubes and multiple floating diffusion area capacitors, and can sample and buffer the image signals generated by the photodiode in time-sharing to obtain Multiple high-time-resolved image data.

[0037] Take four-port sampling CMOS image sensor pixel structure model as example below, the present invention is described in detail:

[0038] Such as figure 2 As shown, the four gate valves are evenly distributed around the photodiode, and each gate valve is connected to a floating diffusion area capacitor. The four floating diffusion area capacitors share a control transistor circuit and are controlled by four charge output gating switches. The time-division transmission of the capacitor buffer signal in the floating diffusio...

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Abstract

The invention provides a pixel structure of a multi-sampling CMOS image sensor and an ultra-high speed image acquisition method thereof in order to solve the technical problems of high cost, poor imaging performance and complex process when the ultra-high speed imaging capability of the CMOS image sensor in tens of nanoseconds level is realized by adopting the prior art. Each pixel structure comprises a photodiode; the n output ports of the photodiode are all connected with a control switch tube; at the output end of each control switch tube, a floating diffusion region capacitor is connected;n floating diffusion region capacitors share a control transistor circuit; a charge output strobe switch is arranged between each floating diffusion region capacitor and the control transistor circuit; n >= 2. The frame interval between the multi-frame buffered images is determined by the transfer time of the image signal from the photodiode to the capacitance of the floating diffusion region. Under the modern CMOS technology, the transfer time can reach the order of hundreds of nanoseconds, and the ultra-high-speed continuous multi-frame imaging under the condition of hundreds of nanosecondstime resolution of the CMOS image sensor can be realized.

Description

technical field [0001] The invention relates to the fields of high-speed imaging and optical image sensors, in particular to a multi-sampling CMOS image sensor pixel structure and an ultra-high-speed image acquisition method thereof. Background technique [0002] Ultra-high-speed imaging systems can acquire transient images of microsecond or even nanosecond ultrafast reaction processes, which is of great significance to the mechanism research of ultrafast processes, and the image sensor chip plays a key role as the core device of the imaging system. [0003] There are two main types of traditional image sensors: CCD image sensors and CMOS image sensors. Compared with CCD image sensors, CMOS image sensors have the advantages of low cost, low power consumption, low development difficulty, and various analog or digital circuits can be integrated on-chip. With the continuous advancement of modern CMOS technology, CMOS image sensors have developed into Mainstream image sensor on...

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Application Information

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IPC IPC(8): H04N5/3745H04N5/378
CPCH04N25/77H04N25/75
Inventor 杨少华刘璐严明郭明安李刚李斌康
Owner NORTHWEST INST OF NUCLEAR TECH
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