Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

View rendering system, spectrum analyzer, and rendering method

A rendering system and view technology, applied in the field of view rendering system, can solve problems such as prolonging a single rendering time, increasing battery power consumption, and many rendering elements, so as to avoid repeated rendering calculations, improve flexibility and adaptability, and improve analysis efficiency Effect

Pending Publication Date: 2018-12-21
INNO INSTR (CHINA) INC +1
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The view of the spectrum analysis software is composed of multiple elements. There are many rendering elements and a large amount of calculation. This single-layer double-buffer rendering method will change the content that does not change or passively change during the continuous measurement process, such as logarithmic distribution in the view. Elements such as the background grid, reference amplitude, and scan information are repeatedly rendered along with the continuously changing signal curve. This repeated rendering containing a large number of floating-point logarithmic calculations will continue to consume CPU resources and prolong the single Rendering time and increased battery power consumption, thereby reducing the analysis efficiency and battery life of the handheld spectrum analyzer

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • View rendering system, spectrum analyzer, and rendering method
  • View rendering system, spectrum analyzer, and rendering method
  • View rendering system, spectrum analyzer, and rendering method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] Hereinafter, specific embodiments of the present invention will be further described in conjunction with the accompanying drawings.

[0026] A view rendering system provided by the present invention includes a first element buffer unit and a second element buffer unit, the first element buffer unit is used for continuous rendering of continuously changing elements of the view; the second element buffer unit is used for view Rendering of elements that don't change or change passively.

[0027] The present invention also provides a spectrum analyzer based on the above-mentioned view rendering system, wherein the first element buffer unit is used for continuous rendering of continuously changing elements of the view during the frequency sweep analysis process, such as signal curves, frequency markers, etc. The second element buffer unit is used for the rendering of the constant or passively changing elements of the view during the frequency sweep analysis, and separates th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a view rendering system, a spectrum analyzer and a rendering method, belonging to the technical field of view rendering, in particular to a view rendering system, a spectrum analyzer and a rendering method. Includes a first element buffer unit and a second element buffer unit, wherein the first element buffer unit is used for continuously rendering a continuously changing rendering element of a view during sweep analysis; The second element buffer unit is used for rendering the invariant or passively changed elements of the view in the sweep frequency analysis process, and separates the rendering of the invariant or passively changed elements from the rendering thread, and performs independent rendering in the second element buffer unit only when the elements are changed. The second element buffer unit is used for rendering the invariant or passively changed elements of the view. The invention effectively avoids repeated rendering calculation of elements in the view which are unchanged or passively changed in the view rendering process, realizes the rendering calculation only when needed, and has the positive effects of effectively improving the analysis efficiency and saving the power consumption.

Description

technical field [0001] The invention belongs to the technical field of view rendering, and in particular relates to a view rendering system, a spectrum analyzer and a rendering method. Background technique [0002] The view rendering process is the process after the ModelAndView is obtained, that is, the view rendering process is to pack the model into a map form and bring it to the server through the request attribute. [0003] Spectrum analyzer is an instrument for studying the spectrum structure of electrical signals. It is used to measure signal parameters such as signal distortion, modulation degree, spectral purity, frequency stability and intermodulation distortion. It can be used to measure certain components of circuit systems such as amplifiers and filters. Parameter, is a multipurpose electronic measuring instrument. [0004] The embedded spectrum analysis software (hereinafter referred to as the spectrum analysis software) carried by the handheld spectrum analyz...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T15/00
CPCG06T15/005
Inventor 赵阳日
Owner INNO INSTR (CHINA) INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products